journal article·1992-01

Silicon nitride/semiconductor interface state density as a function of the insulator stoichiometry

P.E. Bagnoli, A. Piccirillo, P. Valenti, G. Civale, A.L. Gobbi

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Semiconductor materials and devices · Semiconductor materials and interfaces · Advancements in Semiconductor Devices and Circuit Design

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References (12)

Show source-provided references
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8. Ducroquet · 1990 · 125
9. A. Piccirillo, R. Marzano and A.L. Gobbi, submitted.
10. Krawczyk · Le Vide, Les Couches Mines · 1981 · 43 · 193
11. Hasegawa · Thin Solid Films · 1983 · 103 · 11910.1016/0040-6090(83)90430-3 ↗
12. Spicer · Appl. Surf. Sci. · 1988 · 33/34 · 100910.1016/0169-4332(88)90411-4 ↗