Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry
Source abstract
Abstract
Abstract The article deals with determination of complex refractive indexes of organic thin films; the assessment was implemented by spectroscopic ellipsometry. Thin films of π-conjugated MDMO-PPV, PCDTBT, and PCBTDPP polymers blended with PC 60 BM and PC 70 BM fullerenes were subjected to investigation. Recently, these materials have intensively been studied for their potential application in photovoltaics. This article summarizes research findings on refractive indexes and extinction coefficients of the above studied pure materials and their mixtures. The obtained ellipsometric data were evaluated according to the Tauc–Lorentz model.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Organic Electronics and Photovoltaics · Thin-Film Transistor Technologies · Conducting polymers and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (19)
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