Structure and morphology of CuPc and F16CuPc pn heterojunction

Abstract This article reports structure and morphology of copper phthalocyanine (CuPc) and fluorinated copper phthalocyanine (F 16 CuPc) pn heterojunction. Highly ordered CuPc and F 16 CuPc polycrystalline thin films with the 2 0 0 plane spacing s of 1.30 and 1.56 nm, respectively, could be continuously grown via an intermediate-phase layer. Compared with CuPc, the intermediate-phase layer is much thinner when F 16 CuPc is used as the first layer. The rougher the first layer is, the thicker the intermediate-phase layer is. Similarly, the 2 0 0 plane spacings of the intermediate-phase layer are dependent on morphology of the first layer. Furthermore, morphology of the heterostructure is mainly dominated by that of CuPc films. Due to the thicker intermediate-phase layer in the CuPc/F 16 CuPc heterostructure, the thin film transistors (TFT) performance is obviously inferior to that of the F 16 CuPc/CuPc device.