Structure and refractive index dispersive behavior of potassium niobate tantalate films prepared by pulsed laser deposition
Source abstract
Abstract
Abstract Pure perovskite phase and crack-free KTa 0.5 Nb 0.5 O 3 thin films were prepared on Pt/Ti/SiO 2 /Si substrates by pulsed laser deposition. The structure and orientation were analyzed by X-ray diffraction. The optical properties were investigated by an ellipsometer. The relationship between the refractive index dispersive behavior and internal structure was analyzed by Sellmeier dispersion model and single electronic oscillator approximation. The parameters of room temperature monomial Sellmeier oscillator were calculated. And the refractive index dispersive parameter E 0 / S 0 of KTa 0.5 Nb 0.5 O 3 thin films on Pt/Ti/SiO 2 /Si substrates is (6.72 ± 0.04) × 10 −14 eV m 2 , which is consistent with those of KTN crystals and compounds with ABO 3 perovskite type structure.
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Research context
OpenAlex topics: Ferroelectric and Piezoelectric Materials · Photorefractive and Nonlinear Optics · Microwave Dielectric Ceramics Synthesis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (34)
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