Structural and electrical properties of (Na0.85K0.15)0.5Bi0.5TiO3 thin films deposited on LaNiO3 and Pt bottom electrodes

Abstract (Na 0.85 K 0.15 ) 0.5 Bi 0.5 TiO 3 thin films were deposited on LaNiO 3 (LNO)/SiO 2 /Si(1 0 0) and Pt/Ti/SiO 2 /Si(1 0 0) substrates by metal–organic decomposition, and the effects of bottom electrodes LNO and Pt on the ferroelectric, dielectric and piezoelectric properties were investigated by ferroelectric tester, impedance analyzer and scanning probe microscopy, respectively. For the thin films deposited on LNO and Pt electrodes, the remnant polarization 2 P r are about 22.6 and 8.8 μC/cm 2 under 375 kV/cm, the dielectric constants 238 and 579 at 10 kHz, the dielectric losses 0.06 and 0.30 at 10 kHz, the statistic d 33eff values 95 and 81 pm/V. The improved piezoelectric properties could make (Na 1− x K x ) 0.5 Bi 0.5 TiO 3 thin film as a promising candidate for piezoelectric thin film devices.