Functionality of the ferroelectric/oxide semiconductor interface
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Research context
OpenAlex topics: Surface Roughness and Optical Measurements
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References (6)
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1. Crawford · IEEE Trans. Electron Devices · 1969 · ED-16 · 52510.1109/T-ED.1969.16793 ↗
2. Teather · Solid-State Electron. · 1968 · 11 · 52710.1016/0038-1101(68)90091-9 ↗
3. Omoto · Ferroelectrics · 1978 · 22 · 76710.1080/00150197808237393 ↗
4. Tuttle · MRS Symp. Proc. · 1993 · 310 · 7110.1557/PROC-310-71 ↗
5. Seager · Appl. Phys. Lett. · 1996 · 68 · 266010.1063/1.116273 ↗
6. Seager · Int. Ferroelect. · 1995 · 7