Negative refraction by a planar Ag/SiO2 multilayer at ultraviolet wavelength to the limit of silver
Source abstract
Abstract
For planar structured hyperbolic metamaterial, the shortest wavelength achievable for negative refraction is often limited by dielectric layers, which are usually wide band gap semiconductors that absorb light strongly at wavelength shorter than their absorption edge. Here we proposed that using SiO2 may break such limitation based on effective medium theory. Through calculation and simulation we demonstrated broad angle negative refraction by a planar Ag/SiO2 layered structure at wavelength down to 326 nm. Its imaging and focusing abilities were also presented. The lower limit of wavelength here is defined by the property of silver, whose permittivity turns positive below 324 nm.
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Research context
OpenAlex topics: Metamaterials and Metasurfaces Applications · Advanced Antenna and Metasurface Technologies · Antenna Design and Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Chinese Academy of Sciences 1 Key Laboratory for Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics and Physics, , 3888 Dongnanhu Road, Changchun, Jilin, 130033, P. R. China
University of Chinese Academy of Sciences 2 , Beijing, 100039, China
Chinese Academy of Sciences 3 State Key Laboratory of Luminescence and Applications, Changchun Institute of Optics, Fine Mechanics and Physics, , 3888 Dongnanhu Road, Changchun, Jilin, 130033, P. R. China
Funding
CAS
References (23)
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