One-shot x-ray detection based on the instantaneous change in the refractive index of GaAs
Source abstract
Abstract
An interferometric semiconductor x-ray detection system is proposed in this paper. The system is based on the RadOptic effect, and it utilizes Fabry–Perot interferometry to measure radiation-induced changes in the optical refractive index of a semiconductor (GaAs). In this work, the intrinsic time resolution and the sensitivity of a Fabry–Perot interferometric sensor were systemically studied. Based on the transient free carrier absorption model, the prototype system was established to quantitatively measure the time-dependent x-ray flux with the deconvolution algorithm for the first time. The time resolution of the detection system was approximately 21 ps, and the output signal induced by an x-ray pulse showed a high signal-to-noise ratio and immunity to electromagnetic interference. This interferometer will enable x-ray bang-time and fusion burn-history measurements in inertial confinement fusion with higher time resolution.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Laser-Plasma Interactions and Diagnostics · Advanced X-ray Imaging Techniques · Particle Detector Development and Performance
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Key Laboratory of Ultra-Fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics (XIOPM), Chinese Academy of Sciences (CAS) 1 , Xi’an, Shaanxi 710119, China
Research Center of Laser Fusion, China Academy of Engineering Physics 2 , Mianyang, Sichuan 621900, China
College of Physics, Sichuan University 3 , Chendu, Sichuan 610064, China
Rocket Force Academy 4 , Beijing 100101, China
Funding
Natural Science Foundation of Shaanxi Province · National Natural Science Foundation of China
References (18)
Show source-provided references
1. The first measurements of soft x-ray flux from ignition scale Hohlraums at the National Ignition Facility using DANTE (invited)10.1063/1.3491032 ↗
2. A novel flat-response x-ray detector in the photon energy range of 0.1–4 keV10.1063/1.3460269 ↗
3. A compact flat-response x-ray detector for the radiation flux in the range from 1.6 keV to 4.4 keV10.1088/0957-0233/23/6/065902 ↗
4. Reproducible, rugged, and inexpensive photocathode x-ray diode10.1063/1.2969279 ↗
5. Review of the National Ignition Campaign 2009-201210.1063/1.4865400 ↗
6. Deconvolving the temporal response of photoelectric x-ray detectors for the diagnosis of pulsed radiations10.1063/1.4821984 ↗
7. Femtosecond electronic response of atoms to ultra-intense x-rays10.1038/nature09177 ↗
8. A femtosecond x-ray/optical cross-correlator10.1038/nphoton.2007.298 ↗
9. Photorefractive effect of low-temperature-grown aluminum gallium arsenide10.7498/aps.68.20190459 ↗
10. Solid-state ultrafast all-optical streak camera enabling high-dynamic-range picosecond recording10.1364/ol.35.001389 ↗
11. Solid-state framing camera with multiple time frames10.1063/1.4824192 ↗
12. Ultrafast all-optical solid-state framing camera with picosecond temporal resolution10.1364/oe.25.008721 ↗
13. Ultrafast all-optical imaging technique using low-temperature grown GaAs/AlxGa1−xAs multiple-quantum-well semiconductor10.1016/j.physleta.2017.08.064 ↗
14. X-ray bang-time and fusion reaction history at picosecond resolution using RadOptic detection10.1063/1.4729677 ↗
15. Enhanced RadOptic sensitivity in intrinsic bulk InP10.1063/1.5021873 ↗
16. Electron cascades in sensors for optical detection of ionizing radiation10.1063/1.4825042 ↗
17. RadTracker: Optical imaging of high energy radiation tracks
18. Research on MeV pulsed radiation detection based on refractive index modulation10.7498/aps.65.157801 ↗