journal article·2017-08-01Open access

Room temperature transparent conducting magnetic oxide (TCMO) properties in heavy ion doped oxide semiconductor

Juwon Lee, Ganapathi Subramaniam Nagarajan, Yoon Shon, Younghae Kwon, Tae Won Kang, Deuk Yong Kim, Hyungsang Kim, Hyunsik Im, Chang-Soo Park, Eun Kyu Kim

AIP Advances· Volume 7· Issue 8

Abstract

Bismuth doped ZnO (ZnBi0.03O0.97) thin films are grown using pulsed laser deposition. The existence of positively charged Bi, absence of metallic zinc and the Zn-O bond formation in Bi doped ZnO are confirmed using X-ray Photoelectron Spectroscopy (XPS). Temperature dependent resistivity and UV-visible absorption spectra show lowest resistivity with 8.44 × 10-4 Ω cm at 300 K and average transmittance of 93 % in the visible region respectively. The robust ferromagnetic signature is observed at 350 K (7.156 × 10-4 emu/g). This study suggests that Bi doped ZnO films should be a potential candidate for spin based optoelectronic applications.
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Research context

OpenAlex topics: ZnO doping and properties · Electronic and Structural Properties of Oxides · Copper-based nanomaterials and applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Quantum-Functional Semiconductor Research Center and Nano Information Technology Academy(NITA), Dongguk University-Seoul 1 , Seoul 100-715, Republic of Korea

Division of Physics and Semiconductor Science, Dongguk University 2 , Seoul 100-715, Republic of Korea

Quantum-Function Spinics Laboratory and Department of Physics, Hanyang University 3 , Seoul 133-791, Republic of Korea

Funding

National Research Foundation of Korea

References (31)

Show source-provided references
1. Appl. Phys. Lett. · 2002 · 81 · 402010.1063/1.1517405 ↗
2. Nat. Mater. · 2003 · 2 · 67310.1038/nmat984 ↗
3. J. Elec. Mater. · 2007 · 36 · 46210.1007/s11664-006-0034-z ↗
4. Science · 2001 · 291 · 85410.1126/science.1056186 ↗
5. Appl. Phys. Lett. · 2004 · 84 · 260210.1063/1.1703848 ↗
6. Appl. Phys. Lett. · 2008 · 92 · 18250710.1063/1.2920818 ↗
7. Appl. Phys. Lett. · 2004 · 84 · 133210.1063/1.1650041 ↗
8. Nat. Mater. · 2006 · 5 · 29810.1038/nmat1613 ↗
9. Phys. Rev. Lett. · 2008 · 101 · 02720310.1103/physrevlett.101.027203 ↗
10. 2009 · 318
11. Jpn. J. Appl. Phys. · 2000 · 39 · L55510.1143/jjap.39.l555 ↗
12. J. Am. Ceram. Soc. · 2008 · 91 · 157210.1111/j.1551-2916.2008.02309.x ↗
13. Appl. Phys. Lett. · 2006 · 89 · 05210310.1063/1.2243732 ↗
14. J. Mater. Sci. Mater. Electron. · 2005 · 16 · 42110.1007/s10854-005-2308-2 ↗
15. Europhys. Lett. · 2011 · 95 · 4700210.1209/0295-5075/95/47002 ↗
16. Scientific Reports · 2015 · 5 · 1705310.1038/srep17053 ↗
17. Philips Res. Rep. · 1958 · 13 · 1
18. Fundamental XPS data from pure elements, pure oxides and chemical compounds, Copy rights 1999 XPS International Inc., http://www.xpsdata.com/fundxps.pdf.
19. J. Electraon Spectrosc. Relat. Phenom. · 1980 · 21 · 27510.1016/0368-2048(80)85056-0 ↗
20. 1985
21. Chem. Mater · 2002 · 14 · 11610.1021/cm011088y ↗
22. Appl. Phys. Lett. · 2006 · 88 · 08211110.1063/1.2178466 ↗
23. Appl. Phys. Lett. · 2006 · 89 · 05210310.1063/1.2243732 ↗
24. Nat. Mater. · 2006 · 5 · 29810.1038/nmat1613 ↗
25. Phys.Rev. B · 1995 · 51 · 1410310.1103/physrevb.51.14103 ↗
26. Phys. Stat. Sol. (b) · 1966 · 15 · 62710.1002/pssb.19660150224 ↗
27. Proc. Phys. Soc. Lond. B · 1954 · 67 · 77510.1088/0370-1301/67/10/306 ↗
28. Phys. Stat. Sol. (b) · 2007 · 244 · 3021
29. Appl. Phys. Lett. · 2006 · 88 · 11251210.1063/1.2172011 ↗
30. A comprehensive review of ZnO materials and devices10.1063/1.1992666 ↗
31. 2008 · 50