Noise-based analysis of the reliability of silicon solar cells
Source abstract
Abstract
With silicon solar cells as the research object, this paper takes their nondestructive character and analyzes their quality with noise-based technology. Through the stress aging of samples and the testing of various types of noise, including 1/f noise, microplasma noise, and G-R noise, in the cells in the laboratory, the noise characteristics are analyzed. The research results show that noise is correlated with defects in silicon solar cells. The different types of noise can be used to characterize different parts and types of defects in the cells according to the mechanism of generation of noise and the failure physics of photovoltaic devices, and thereby, the evaluation of the quality and analysis of the reliability of solar cells can be achieved.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Photovoltaic System Optimization Techniques · Silicon and Solar Cell Technologies · Thin-Film Transistor Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Electronic and Information Engineering, Ankang University 1 , AnKang 725000, China
Advanced Materials and Nano Technology School, Xidian University 2 , Xi an 710071, China
Funding
National Natural Science Foundation of China · Outstanding Young Talents Project in Shaanxi Province · The Scientific Research Fund of Shaanxi Provincial Education Department · The Science and Technology in Ankang Project
References (22)
Show source-provided references
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