First-principles study on the electron and phonon transport properties of layered Bi2OX2 (X = S, Se)
Source abstract
Abstract
The electron and phonon transport properties of layered bismuth oxychalcogenides Bi2OX2 (X = S, Se) are studied by combining density functional theory calculation with the Boltzmann transport theory. It is found that Bi2OS2 and Bi2OSe2 are semiconductors with direct bandgaps of 0.86 eV and 0.63 eV, respectively. A large Seebeck coefficient is found in both p- and n-doped Bi2OX2 (X = S, Se) at 300 K together with their low phonon thermal conductivity (κph). Through a detailed analysis of the phonon dispersion relation, relaxation time, and joint density of states, we find that the low frequency modes contribute dominantly to κph than the high frequency modes. Owing to the high Seebeck coefficient and the low κph, the largest figure of merit (ZT) value can reach 0.5 for the Bi2OX2. The results are useful for further tuning the thermoelectric properties of Bi2OX2 (X = S, Se).
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Research context
OpenAlex topics: Advanced Thermoelectric Materials and Devices · Chalcogenide Semiconductor Thin Films · Heusler alloys: electronic and magnetic properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
School of Science, Zhongyuan University of Technology 1 , Zhengzhou 450007, People’s Republic of China
School of Physics and Electrical Engineering, Anyang Normal University 2 , Anyang 455002, People’s Republic of China
School of Physics, Huazhong University of Science and Technology 3 , 430074 Wuhan, People’s Republic of China
Funding
National Key Research and Development Program of China · The Program for HUST Academic Frontier Youth Team · National Natural Science Foundation of China
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