Low resistivity ZnO-GO electron transport layer based CH3NH3PbI3 solar cells
Source abstract
Abstract
Perovskite based solar cells have demonstrated impressive performances. Controlled environment synthesis and expensive hole transport material impede their potential commercialization. We report ambient air synthesis of hole transport layer free devices using ZnO-GO as electron selective contacts. Solar cells fabricated with hole transport layer free architecture under ambient air conditions with ZnO as electron selective contact achieved an efficiency of 3.02%. We have demonstrated that by incorporating GO in ZnO matrix, low resistivity electron selective contacts, critical to improve the performance, can be achieved. We could achieve max efficiency of 4.52% with our completed devices for ZnO: GO composite. Impedance spectroscopy confirmed the decrease in series resistance and an increase in recombination resistance with inclusion of GO in ZnO matrix. Effect of temperature on completed devices was investigated by recording impedance spectra at 40 and 60 oC, providing indirect evidence of the performance of solar cells at elevated temperatures.
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Research context
OpenAlex topics: Perovskite Materials and Applications · Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
National University of Sciences and Technology 1 School of Chemical and Materials Engineering, , Islamabad, 44000, Pakistan
University of Sciences and Technology 2 College of Aeronautical Engineering, National , Islamabad, 44000, Pakistan
University of Hafar Al Batin 3 The Department of Physics, College of Sciences, , P.O. Box 1803, Hafar Al Batin 31991 Saudi Arabia
Funding
Higher Education Commission, Pakistan
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62. See supplementary material at http://dx.doi.org/10.1063/1.4953397 for effects of processing condition on morphology of CH3NH3PbI3films and roughness profiles of CH3NH3PbI3 and ZnO-GO films. Also included is the optical profilometer thickness profile for ZnO films used for resistivity measurements and EDS data for ZnO-GO nanocomposite.