Performance change of few layer black phosphorus transistors in ambient

Transistors were fabricated based on mechanical exfoliated few layer black phosphorus (BP) flakes, and performance change of these devices exposed to air was explored systematically. BP devices were found to suffer severe performance degradation in ambient conditions, and the field effect mobility drops to less than 1/10 of the original in no more than 120 hours after fabrication. However the current on/off ratio shows completely different time dependent behavior to the published result, i.e. increases with exposure time in air, since the minimum current decreases with exposure time to air, which is probably originated from the decrease of layer number in BP. A model is developed to estimate the bandgap change of BP according to the time dependent minimum current of the BP device.