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journal article·2018-10-01Open access

Application of MIS-CELIV technique to measure hole mobility of hole-transport material for organic light-emitting diodes

Chiho Katagiri, Tsukasa Yoshida, Matthew Schuette White, Cigdem Yumusak, Niyazi Serdar Sariciftci, Ken-ichi Nakayama

AIP Advances· Volume 8· Issue 10
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Source abstract

Abstract

Injection-charge extraction by linearly increasing voltage in metal-insulator-semiconductor structures (MIS-CELIV) is applied for the hole mobility measurement of N,N’-Bis(naphthalen-1-yl)-N,N’-bis(phenyl)-benzidine (NPB), which is a standard hole-transporting material for organic light-emitting diodes. Ideal transient currents in agreement with the theory are observed in the NPB film due to its amorphous and homogenous structure, which is regarded as a continuous dielectric. This ideal response enables us to discuss the validity of the MIS-CELIV mobility by comparing its absolute value with that of the conventional space-charge-limited current method. In addition, to establish an experimental guideline for precise measurements, the effect of the voltage drop on the insulator is investigated.
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Research context

Electronic materials

OpenAlex topics: Organic Light-Emitting Diodes Research · Organic Electronics and Photovoltaics · Molecular Junctions and Nanostructures

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Organic Materials Engineering, Graduate School of Science and Engineering, Yamagata University 1 , 4-3-16 Jonan, Yonezawa, Yamagata 992-8510, Japan

Department of Material and Life Science, Graduate School of Engineering, Osaka University 2 , 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

Department of Physics, University of Vermont 3 , Burlington, Vermont 05405, USA

Linz Institute for Organic Solar Cells (LIOS), Physical Chemistry, Johannes Kepler University Linz 4 , Altenbergerstraße 69, Linz 4040, Austria

Funding

Japan Society for the Promotion of Science · Core Research for Evolutional Science and Technology

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