Hysteresis mechanism and control in pentacene organic field-effect transistors with polymer dielectric
Source abstract
Abstract
Hysteresis mechanism of pentacene organic field-effect transistors (OFETs) with polyvinyl alcohol (PVA) and/or polymethyl methacrylate (PMMA) dielectrics is studied. Through analyzing the electrical characteristics of OFETs with various PVA/PMMA arrangements, it shows that charge, which is trapped in PVA bulk and at the interface of pentacene/PVA, is one of the origins of hysteresis. The results also show that memory window is proportional to both trap amount in PVA and charge density at the gate/PVA or PVA/pentacene interfaces. Hence, the controllable memory window of around 0 ∼ 10 V can be realized by controlling the thickness and combination of triple-layer polymer dielectrics.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Organic Electronics and Photovoltaics · Advanced Memory and Neural Computing · Thin-Film Transistor Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
University of Electronic Science and Technology of China (UESTC) State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, , Chengdu 610054, People's Republic of China
References (27)
Show source-provided references
1. Korean J. Chem. Eng. · 2004 · 21 · 26710.1007/BF02705409 ↗
2. Appl. Phys. Lett. · 1998 · 73 · 14210.1063/1.121736 ↗
3. Appl. Phys. Lett. · 2003 · 82 · 396410.1063/1.1579554 ↗
4. Appl. Phys. Lett. · 2006 · 88 · 08350210.1063/1.2178213 ↗
5. AIP Advances · 2011 · 1 · 02214910.1063/1.3608793 ↗
6. Chem. Rev. · 2012 · 112 · 220810.1021/cr100380z ↗
7. Adv. Funct. Mater. · 2003 · 13 · 11910.1002/adfm.200390030 ↗
8. Appl. Phys. Lett. · 2013 · 102 · 11160710.1063/1.4798368 ↗
9. Appl. Phys. Lett. · 2012 · 101 · 03330410.1063/1.4737176 ↗
10. Adv. Mater. · 2013 · 25 · 182210.1002/adma.201202790 ↗
11. Sens. Actuat. B-Chem. · 2012 · 173 · 13310.1016/j.snb.2012.06.060 ↗
12. Chem. Rev. · 2010 · 110 · 20510.1021/cr9001275 ↗
13. Organ. Electron. · 2009 · 10 · 128210.1016/j.orgel.2009.07.006 ↗
14. Appl. Phys. Lett. · 2004 · 85 · 540910.1063/1.1828236 ↗
15. Appl. Phys. Lett. · 2011 · 99 · 14330810.1063/1.3647976 ↗
16. J. Appl. Phys. · 2005 · 97 · 08371410.1063/1.1895466 ↗
17. Adv. Mater. · 2008 · 20 · 101810.1002/adma.200701479 ↗
18. Organ. Electron. · 2011 · 12 · 47710.1016/j.orgel.2010.12.014 ↗
19. Appl. Phys. Lett. · 2006 · 88 · 07210110.1063/1.2173633 ↗
20. Appl. Phys. Lett. · 2006 · 88 · 24211310.1063/1.2209213 ↗
21. Appl. Phys. Lett. · 2006 · 88 · 25210210.1063/1.2213969 ↗
22. Appl. Phys. Lett. · 2012 · 101 · 03330310.1063/1.4737173 ↗
23. J. Korean Phys. Soc. · 2004 · 44 · 181
24. AIP Advances · 2012 · 2 · 02211310.1063/1.4707164 ↗
25. Synth. Met. · 2003 · 137 · 96710.1016/S0379-6779(02)00958-X ↗
26. Thin Solid Films · 2012 · 520 · 667710.1016/j.tsf.2012.06.084 ↗
27. Mater. Lett. · 1994 · 21 · 42510.1016/0167-577X(94)90253-4 ↗