DataVXAdvanced SciencePaper
journal article·2019-06Open access

Surface‐Enhanced Raman Scattering: A Novel Ultra‐Sensitive Semiconductor SERS Substrate Boosted by the Coupled Resonance Effect (Adv. Sci. 12/2019)

Lili Yang, Yusi Peng, Yong Yang, Jianjun Liu, Haoliang Huang, Bohan Yu, Jimin Zhao, Yalin Lu, Zhengren Huang, Zhiyuan Li, John R. Lombardi

Advanced Science· Volume 6· Issue 12
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Source abstract

Abstract

In article 1900310, Yong Yang and co-workers present a strategy, the “coupled resonance” effect, matching the excitation wavelength with the molecular resonance, charge transfer (CT) resonance and electromagnetic resonance of the surface-enhanced raman scattering (SERS) substrate, to optimize the SERS performance of a new semiconductor SERS-active substrate Ta2O5 by energy band engineering. Furthermore, the concomitant photoinduced degradation of probed molecules in the time-scale of SERS detection is revealed as a non-negligible factor that limits the SERS performance of some semiconductors with photocatalytic activity.
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Research context

Electronic materialsCatalysis & surfaces

OpenAlex topics: Advanced Nanomaterials in Catalysis · Gold and Silver Nanoparticles Synthesis and Applications

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Affiliations

State Key Laboratory of High Performance Ceramics and Superfine Microstructures Shanghai Institute of Ceramics Chinese Academy of Sciences 1295 Dingxi Road Shanghai 200050 P. R. China

University of Chinese Academy of Sciences No.19(A) Yuquan Road Beijing 100049 P. R. China

Center of Materials Science and Optoelectronics Engineering University of Chinese Academy of Sciences Beijing 100049 P. R. China

National Synchrotron Radiation Laboratory University of Science and Technology of China Hefei 230026 P. R. China

Beijing National Laboratory for Condensed Matter Physics Institute of Physics Chinese Academy of Sciences Beijing 100190 P. R. China

South China University of Technology Guangzhou 510640 Guangdong P. R. China

Department of Chemistry The City College of New York 160 Convent Avenue New York NY 10031 USA

References

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