Mitigating Ion Migration with Alternating Voltage for Stable Perovskite Image Sensors
Source abstract
Abstract
Perovskite photodetectors have emerged as a potential replacement for silicon photodiodes in modern cameras due to their high sensitivity to visible light and ability to be easily integrated into existing electronics. However, the use of perovskite photodetectors in conventional CMOS image sensors requires the application of reverse bias, which can lead to unstable detector performance due to ion migration effects. In this article, we propose a new approach that involves the application of forward voltage pulses to attenuate ion migration while still enabling the capture of photocurrent under reverse bias. Our results show that using this technique after each cycle of signal integration allows for stable operation of perovskite photodetectors for over 180 h, while applying a constant reverse bias leads to degradation within just 10 min. Additionally, we demonstrate stable imaging using alternating voltage and 8 × 8 crossbar arrays of perovskite photodetectors.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: CCD and CMOS Imaging Sensors · Perovskite Materials and Applications · Advanced Memory and Neural Computing
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Laboratory of Inorganic Chemistry, Department of Chemistry and Applied Biosciences
ETH Zürich
Laboratory for Thin Films and Photovoltaics
Empa − Swiss Federal Laboratories for Materials Science and Technology
Laboratory of Integrated Systems, Department Information Technology and Electrical Engineering
Funding
Eidgenössische Technische Hochschule Zürich
References (51)
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