Correction to “Accurate Assessments of the Electronic Structures of Ultrathin PtSe ₂ : Bandgap Quantification and Critical Thickness for the Metal–Semiconductor Transition”

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Research context

OpenAlex topics: Surface and Thin Film Phenomena · Machine Learning in Materials Science · Advanced Materials Characterization Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Division of Chemical and Material Metrology

Korea Research Institute of Standards and Science

Department of Physics and Astronomy

Sejong University

Department of Physics and Chemistry

Daegu Gyeongbuk Institute of Science and Technology (DGIST)

Advanced Materials Laboratory

National Institute for Materials Science

Funding

Daegu Gyeongbuk Institute of Science and Technology · National Research Foundation of Korea · Korea Research Institute of Standards and Science

References

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