journal article·2024-07-03Open access

Correction to “A Critical Review of Thermal Boundary Conductance across Wide and Ultrawide Bandgap Semiconductor Interfaces”

Tianli Feng, Hao Zhou, Zhe Cheng, Leighann Sarah Larkin, Mahesh R. Neupane

ACS Applied Materials & Interfaces· Volume 16· Issue 26

Abstract

ADVERTISEMENT RETURN TO ARTICLES ASAPPREVAddition/CorrectionNEXTORIGINAL ARTICLEThis notice is a correctionCorrection to "A Critical Review of Thermal Boundary Conductance across Wide and Ultrawide Bandgap Semiconductor Interfaces"Tianli Feng*Tianli FengMore by Tianli Fenghttps://orcid.org/0000-0002-7284-5657, Hao ZhouHao ZhouMore by Hao Zhouhttps://orcid.org/0000-0001-6499-1921, Zhe ChengZhe ChengMore by Zhe Chenghttps://orcid.org/0000-0001-7827-2979, Leighann Sarah LarkinLeighann Sarah LarkinMore by Leighann Sarah Larkin, and Mahesh R. NeupaneMahesh R. NeupaneMore by Mahesh R. NeupaneCite this: ACS Appl. Mater. Interfaces 2024, XXXX, XXX, XXX-XXXPublication Date (Web):June 18, 2024Publication History Received31 May 2024Published online18 June 2024https://pubs.acs.org/doi/10.1021/acsami.4c08962https://doi.org/10.1021/acsami.4c08962correctionACS Publications© 2024 American Chemical Society. This publication is available under these Terms of Use. Request reuse permissions This publication is free to access through this site. Learn MoreArticle Views-Altmetric-Citations-LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail PDF (3 MB) Get e-Alertsclose Get e-Alerts
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Research context

OpenAlex topics: Surface and Thin Film Phenomena · Thermal properties of materials · Semiconductor materials and devices

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