Growth, Microstructure, and Infrared-Ultraviolet Optical Conductivity of La_0.5Sr_0.5CoO₃ Nanocrystalline Films on Silicon Substrates by Pulsed Laser Deposition

La(0.5)Sr(0.5)CoO(3) (LSCO) nanocrystalline (nc) films have been directly grown on silicon wafers under different substrate temperatures by pulsed laser deposition. The X-ray diffraction analysis indicate that the films are polycrystalline with the pure perovskite phase at higher substrate temperatures. The columnar growth formation with the nanocrystalline structure in the films has been confirmed by microscopy experiments. Infrared-ultraviolet optical properties of the LSCO films have been investigated with the aid of spectroscopic ellipsometry (SE). Dielectric function in the photon energy range of 1.1-3.1 eV (400-1100 nm) has been extracted by reproducing the experimental data with a Lorentz oscillator model. It is found that the real part is decreased from 4.7 to -0.7 at the near-infrared region with increasing substrate temperature. The optical conductivity shows a different variation trend for the lower and higher growth temperatures, respectively. Note that the films deposited above 650 degrees C exhibit the well-defined metallic phase behavior. The discrepancies could be mainly ascribed to different crystalline structure and surface morphology. The present results may be crucial for future applications of ferromagnetic-based optoelectronic and spin-electronic devices.