journal article·2022-01-12

Long-Wavelength Instabilities Impact Alignment during Blade Coating of a Stretchable Organic Transistor Blend

Peter J. Dudenas, Eliot Gann, Guillaume Freychet, Lee J. Richter, Dean M. DeLongchamp

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Abstract

The use of polymer-polymer blends to tailor mechanical properties and improve electrical performance is becoming widespread in the field of printed electronics. Similarly, meniscus-guided coating can be used to tailor electrical properties through alignment of the semiconducting material. We report on a long-wavelength instability during blade coating of a semiconducting polymer/elastomer blend for organic transistor applications that results in significant variation of the semiconducting polymer nanofibril alignment across the instability period. By correlating measurements over diverse (nm to mm) length scales, we can directly relate the charge transport in top-gate transistors to the local polymer nanofibril alignment. Hole mobility is directly correlated to the local alignment and shows an ≈2 × variation across the instability for devices aligned with the coating direction. The potential for long-wavelength instabilities to create device-relevant morphology variations should be considered when optimizing coating conditions. These results reveal considerable potential for error in assuming that smooth films are necessarily structurally uniform; material structure may spatially vary for some coating methods, leading to a correlated, spatially varying device performance.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advanced Sensor and Energy Harvesting Materials · Organic Electronics and Photovoltaics · Thin-Film Transistor Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States

NSLS-II, Brookhaven National Laboratory, Upton, New York 11973, United States

Funding

Material Measurement Laboratory

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