Macroscopic Versus Microscopic Schottky Barrier Determination at (Au/Pt)/Ge(100): Interfacial Local Modulation
Abstract
Research context
OpenAlex topics: Semiconductor materials and interfaces · Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis
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Affiliations
Innovative Materials and Devices, CNR-SPIN Institute for Superconductors, Corso Perrone 24, I-16152 Genova, Italy
Física Teórica de la Materia Condensada-IFIMAC, Universidad Autonoma de Madrid, E-28049 Madrid, Spain
Dipartimento di Fisica, Universita degli Studi di Genova, via Dodecaneso 33, 16146 Genova, Italy
Materials Characterization Facility, Istituto Italiano di Tecnologia, Via Morego 30, I-16163 Genova, Italy
Jet Propulsion Laboratory, California Institute of Technology, 4800 Oak Grove Drive, Pasadena, California 91104, United States
University Rennes, CNRS, IPR (Institut de Physique de Rennes)—UMR 6251, F-35000 Rennes, France
Instituto de Ciencia de Materiales de Madrid-CSIC, Cantoblanco, E-28049 Madrid, Spain
Funding
Ministero dell?Istruzione, dell?Universit? e della Ricerca · Ministerio de Econom?a y Competitividad · Horizon 2020 Framework Programme