journal article·2024-03-13

High-Performance and Stable Perovskite X-ray Detection and Imaging Based on a Ti Cathode

Wenqing Zhang, Hu Wang, Zhilong Chen, Pengxiang Wang, Xin Liu, Hao Dong, Jiaoling Zhao, Yun Cui, Yuchuan Shao

ACS Applied Materials & Interfaces· Volume 16· Issue 10
Publisher page

Abstract

High-energy radiation detectors with a good imaging resolution, fast response, and high sensitivity are desired to operate at a high electric field. However, strong ion migration triggered by electrochemical reactions at the interface between a high-potential electrode and an organic–inorganic hybrid perovskite limits the stability of radiation detectors under a high electric field. Herein, we demonstrate that such ion migration could be effectively suppressed in devices with a Ti cathode, even at a high electric field of 50 V mm –1, through time-of-flight secondary-ion mass spectrometry. X-ray photoelectron spectroscopy illustrates that Ti–N bonds formed at the interface of MAPbBr 3 perovskite single crystals/Ti electrode effectively inhibit the electrochemical reaction in organic–inorganic hybrid perovskite devices and ultimately improve the operating stability under a high electric field. The device with a Ti electrode reaches a high sensitivity of 96 ± 1 mC Gy air –1 cm –2 and a low detection limit of 2.8 ± 0.3 nGy s –1 under hard X-ray energy.
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Research context

OpenAlex topics: Perovskite Materials and Applications · Luminescence Properties of Advanced Materials · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Laboratory of Thin Film Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

Key Laboratory of Materials for High Power Laser, Chinese Academy of Sciences, Shanghai 201800, China

Key Laboratory for Ultrafine Materials of Ministry of Education, Shanghai Engineering Research Center of Hierarchical Nanomaterials, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 200237, China

School of Microelectronics, Shanghai University, Shanghai 201899, China

Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou 310024, China

Funding

Youth Innovation Promotion Association of the Chinese Academy of Sciences · National Natural Science Foundation of China · Shanghai Explorer Program

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