Dopant-Induced Modifications of Ga_xIn_(1–x)P Nanowire-Based p–n Junctions Monolithically Integrated on Si(111)

Today, silicon is the most used material in photovoltaics, with the maximum conversion efficiency getting very close to the Shockley–Queisser limit for single-junction devices. Integrating silicon with higher band-gap ternary III–V absorbers is the path to increase the conversion efficiency. Here, we report on the first monolithic integration of GaxIn(1–x)P vertical nanowires, and the associated p–n junctions, on silicon by the Au-free template-assisted selective epitaxy (TASE) method. We demonstrate that TASE allows for a high chemical homogeneity of ternary alloys through the nanowires. We then show the influence of doping on the chemical composition and crystal phase, the latter previously attributed to the role of the contact angle in the liquid phase in the vapor–liquid–solid technique. Finally, the emission of the p–n junction is investigated, revealing a shift in the energy of the intraband levels due to the incorporation of dopants. These results clarify some open questions on the effects of doping on ternary III–V nanowire growth and provide the path toward their integration on the silicon platform in order to apply them in next-generation photovoltaic and optoelectronic devices.