journal article·2019-05-22

Integration of a Carbon Nanotube Network on a Microelectromechanical Switch for Ultralong Contact Lifetime

Eunhwan Jo, Min-Ho Seo, Soonjae Pyo, Seung-Deok Ko, Dae-Sung Kwon, Jungwook Choi, Jun-Bo Yoon, Jongbaeg Kim

ACS Applied Materials & Interfaces· Volume 11· Issue 20
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Abstract

Micro-/nanoelectromechanical (MEM/NEM) switches have been extensively studied to address the limitations of transistors, such as the increased standby power consumption and performance dependence on temperature and radiation. However, their lifetimes are limited owing to the degradation of the contact surfaces. Even though several materials and structural designs have been recently developed to improve the lifetime, the production of a microswitch that is compatible with a complementary metal-oxide semiconductor (CMOS) with a long lifetime remains a significant challenge. We demonstrate a vertically actuated MEM switch with extremely high reliability by integrating a carbon nanotube (CNT) network on a gold electrode as the contact material using a low-temperature, CMOS-compatible solution process. In addition to their outstanding mechanical and electrical properties of CNTs, their deformability dramatically increases the effective contact area of the switch, thus resulting in the extension of the lifetime. The CNT-coated MEM switch exhibits a lifetime that is more than 7 × 108 cycles when operated in hot-switching conditions, which is 1.9 × 104 times longer than that of a control device without CNTs. The switch also shows an excellent switching performance, including a low electrical resistance, high on/off ratio, and an extremely small off-state current.
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Research context

OpenAlex topics: Mechanical and Optical Resonators · Advanced MEMS and NEMS Technologies · Nanowire Synthesis and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Mechanical Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea

School of Electrical Engineering, Korea Advanced Institute of Science Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea

Information & Electronics Research Institute, Korea Advanced Institute of Science and Technology (KAIST), 291, Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea

Broadcom Limited, 1730 Fox Dr, San Jose, California 95131, United States

School of Mechanical Engineering, Yeungnam University, 280 Daehak-ro, Gyeongsan, Gyeongbuk 38541, Republic of Korea

Funding

Ministry of Science, ICT and Future Planning

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