journal article·2024-01-17

Monolithically Integrated Complementary Ferroelectric FET XNOR Synapse for the Binary Neural Network

Junghyeon Hwang, Hongrae Joh, Chaeheon Kim, Jinho Ahn, Sanghun Jeon

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Abstract

Neuromorphic computing, which mimics the structure and principles of the human brain, has the potential to facilitate the hardware implementation of next-generation artificial intelligence systems and process large amounts of data with very low power consumption. Among them, the XNOR synapse-based Binary Neural Network (BNN) has been attracting attention due to its compact neural network parameter size and low hardware cost. The previous XNOR synapse has drawbacks, such as a trade-off between cell density and accuracy. In this work, we show nonvolatile XNOR synapses with high density and accuracy using a monolithically stacked complementary ferroelectric field-effect transistor (C-FeFET) composed of a p-type Si MFMIS-FeFET at the bottom and a 3D stackable n-type Al:IZTO MFS-FeTFT, achieving 60F 2 per cell (2C-FeFET). For adjusting the threshold voltage and improving the switching speed (100 ns) of n-type ferroelectric TFT, we employed a dual-gate configuration and a unique operation scheme, making it comparable to those of Si-based FeFETs. We performed array-level simulation with a 512 × 512 subarray size and a 3-bit flash ADC, demonstrating that the image recognition accuracies using the MNIST and CIFAR-10 data sets were increased by 3.17 and 14.07%, respectively, in comparison to other nonvolatile XNOR synapses. In addition, we performed system-level analysis on a 512 × 512 XNOR C-FeFET, exhibiting an outstanding throughput of 717.37 GOPS and an energy efficiency of 196.7 TOPS/W. We expect that our approach would contribute to the high-density memory systems, logic-in-memory technology, and hardware implementation of neural networks.
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Research context

OpenAlex topics: Advanced Memory and Neural Computing · Ferroelectric and Negative Capacitance Devices · Semiconductor materials and devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291, Daehak-ro, Yuseong-gu, Daejeon 34141, Korea

Division of Materials Science and Engineering, Hanyang University, 222, Wangsimni-ro, Seonhdong-gu, Seoul 04763, Korea

Funding

National Research Foundation of Korea · Ministry of Trade, Industry and Energy

References (39)

Show source-provided references
1. Pak, M.; Kim, S. A Review of Deep Learning in Image Recognition. 2017 4th international conference on computer applications and information processing technology (CAIPT); IEEE, 2017; pp 1–3.10.1109/CAIPT.2017.8320684 ↗
2. 10.48550/arXiv.1711.1028210.48550/arXiv.1711.10282 ↗
3. 10.1038/s41586-021-03544-w10.1038/s41586-021-03544-w ↗
4. 10.1021/acsnano.8b0472610.1021/acsnano.8b04726 ↗
5. 10.1021/acsnano.8b0801410.1021/acsnano.8b08014 ↗
6. 10.1021/acsnano.0c0189910.1021/acsnano.0c01899 ↗
7. 10.1021/acsnano.8b0356910.1021/acsnano.8b03569 ↗
8. 10.1021/acsnano.0c0690210.1021/acsnano.0c06902 ↗
9. 10.1186/s40580-021-00289-010.1186/s40580-021-00289-0 ↗
10. 10.1186/s40580-021-00285-410.1186/s40580-021-00285-4 ↗
11. 10.1186/s40580-021-00276-510.1186/s40580-021-00276-5 ↗
12. 10.1109/JSSC.2017.277828110.1109/JSSC.2017.2778281 ↗
13. 10.1021/acsnano.0c0944110.1021/acsnano.0c09441 ↗
14. 10.1021/acsnano.3c0119810.1021/acsnano.3c01198 ↗
15. 10.1021/acsnano.2c0007910.1021/acsnano.2c00079 ↗
16. 10.1109/LED.2022.317938510.1109/LED.2022.3179385 ↗
17. Goh, Y.; Hwang, J.; Kim, M.; Jung, M.; Lim, S.; Jung, S.O.; Jeon, S. High Performance and Self-Rectifying Hafnia-Based Ferroelectric Tunnel Junction for Neuromorphic Computing and Tcam Applications. 2021 IEEE International Electron Devices Meeting (IEDM); IEEE, 2021; pp 17.2.1–17.2.4.10.1109/IEDM19574.2021.9720610 ↗
18. 10.1002/smll.20230527110.1002/smll.202305271 ↗
19. Rastegari, M.; Ordonez, V.; Redmon, J.; Farhadi, A. Xnor-Net: Imagenet Classification Using Binary Convolutional Neural Networks. Computer Vision-ECCV 2016:14th European Conference, Amsterdam, The Netherlands, October 11–14, 2016, Proceedings, Part IV; Springer, 2016; pp 525–542.10.1007/978-3-319-46493-0_32 ↗
20. Hwang, J.; Kim, C.; Shin, H.; Kim, H.; Park, S.H. K.; Jeon, S. Ultra-High Tunneling Electroresistance Ratio (2× 10 4) & Endurance (10 8) in Oxide Semiconductor-Hafnia Self-Rectifying (1.5× 10 3) Ferroelectric Tunnel Junction. 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits); IEEE, 2023; pp 1–2.10.23919/VLSITechnologyandCir57934.2023.10185231 ↗
21. 10.1109/jssc.2019.296361610.1109/jssc.2019.2963616 ↗
22. 10.1109/TED.2020.301517810.1109/TED.2020.3015178 ↗
23. Lee, S.T.; Kim, H.; Bae, J.H.; Yoo, H.; Choi, N. Y.; Kwon, D.; Lim, S.; Park, B.G.; Lee, J.H. High-Density and Highly-Reliable Binary Neural Networks Using Nand Flash Memory Cells as Synaptic Devices. 2019 IEEE International Electron Devices Meeting (IEDM); IEEE, 2019; pp 38.4.1–38.4.4.10.1109/IEDM19573.2019.8993478 ↗
24. 10.1109/JEDS.2020.300878910.1109/JEDS.2020.3008789 ↗
25. 10.1016/j.solmat.2010.05.05610.1016/j.solmat.2010.05.056 ↗
26. 10.1021/acsami.1c1687310.1021/acsami.1c16873 ↗
27. 10.1109/TED.2020.304372810.1109/TED.2020.3043728 ↗
28. 10.1109/TED.2011.216751310.1109/TED.2011.2167513 ↗
29. 10.1109/JPROC.2012.219036910.1109/JPROC.2012.2190369 ↗
30. 10.1109/LED.2020.300163910.1109/LED.2020.3001639 ↗
31. Liang, Z.; Tang, K.; Dong, J.; Li, Q.; Zhou, Y.; Zhu, R.; Wu, Y.; Han, D.; Huang, R. A Novel High-Endurance Fefet Memory Device Based on Zro 2 Anti-Ferroelectric and Igzo Channel. 2021 IEEE International Electron Devices Meeting (IEDM); IEEE, 2021; pp 17.3.1–17.3.4.10.1109/IEDM19574.2021.9720627 ↗
32. Liao, C.Y.; Lou, Z.F.; Lin, C.Y.; Senapati, A.; Karmakar, R.; Hsiang, K.Y.; Li, Z.X.; Ray, W.C.; Lee, J.Y.; Chen, P.H. Superlattice Hfo 2-Zro 2 Based Ferro-Stack Hfzro 2 Fefets: Homogeneous-Domain Merits Ultra-Low Error, Low Programming Voltage 4 V and Robust Endurance 10 9 Cycles for Multibit Nvm. 2022 International Electron Devices Meeting (IEDM); IEEE, 2022; pp 36.6.1–36.6.4.10.1109/IEDM45625.2022.10019369 ↗
33. 10.1109/LED.2022.321326310.1109/LED.2022.3213263 ↗
34. 10.1145/1229175.122917610.1145/1229175.1229176 ↗
35. Ni, K.; Jerry, M.; Smith, J. A.; Datta, S. A Circuit Compatible Accurate Compact Model for Ferroelectric-Fets. 2018 IEEE symposium on VLSI technology; IEEE, 2018; pp 131–132.10.1109/VLSIT.2018.8510622 ↗
36. 10.1109/TED.2022.316516710.1109/TED.2022.3165167 ↗
37. 10.1109/18.95928910.1109/18.959289 ↗
38. 10.1109/JSSC.1989.57262910.1109/JSSC.1989.572629 ↗
39. 10.1049/iet-cds.2010.009210.1049/iet-cds.2010.0092 ↗