journal article·2023-03-15

Fabrication of a VO2-Based Tunable Metasurface by Electric-Field Scanning Probe Lithography with Precise Depth Control

Wenhao Zhang, Xiqi Wu, Liang Li, Chongwen Zou, Yuhang Chen

ACS Applied Materials & Interfaces· Volume 15· Issue 10
Publisher page

Abstract

Vanadium dioxide (VO 2 ) is widely employed in developing tunable optoelectronic devices due to its significant changes in optical and electric properties upon phase transition. To fabricate the VO 2 -based functional devices down to the micro/nanoscale, a high-resolution processing technique is in demand. Scanning probe lithography (SPL) on the basis of a tip-induced electric field provides a promising approach for prototyping. Here, we demonstrated a precise VO 2 etching strategy by direct writing on a VO 2 film with a negative tip bias and subsequent sonication removal of the written area. The effects of bias voltage, sonication, and thermal treatment as well as the mechanical difference between the tip-modulated area and the pristine VO 2 film were investigated systematically. The results show that VO 2 can be etched layer by layer via alternately repeating tip modulation and sonication, and arbitrary patterns can be written. Based on this route, we designed a kind of metasurface by arranging VO 2 –gold nanoblocks with different sizes and heights for spectrally selective tunable reflectivity in near- and mid-infrared. This electric-field SPL method demonstrates the prominent advantages of high resolution down to several tens of nanometers, quasi-3D patterning, and resist-free maskless direct writing, which should be applicable for prototyping other micro/nanodevices.
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Research context

OpenAlex topics: Transition Metal Oxide Nanomaterials · Gas Sensing Nanomaterials and Sensors · Analytical Chemistry and Sensors

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230027, China

Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education Institutes, University of Science and Technology of China, Hefei 230027, China

National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China

Funding

National Natural Science Foundation of China

References (43)

Show source-provided references
1. 10.1116/1.192629310.1116/1.1926293 ↗
2. 10.1021/acs.nanolett.1c0012710.1021/acs.nanolett.1c00127 ↗
3. 10.1021/acs.jpcc.9b0417510.1021/acs.jpcc.9b04175 ↗
4. 10.1021/am200629910.1021/am2006299 ↗
5. 10.1038/nnano.2014.15710.1038/nnano.2014.157 ↗
6. 10.1038/s41378-019-0124-810.1038/s41378-019-0124-8 ↗
7. 10.1038/ncomms220010.1038/ncomms2200 ↗
8. 10.1038/nnano.2016.2510.1038/nnano.2016.25 ↗
9. 10.1038/s41565-020-0755-910.1038/s41565-020-0755-9 ↗
10. 10.1002/adma.20190013610.1002/adma.201900136 ↗
11. 10.1016/j.matdes.2021.10954710.1016/j.matdes.2021.109547 ↗
12. 10.1063/1.491434910.1063/1.4914349 ↗
13. 10.1021/acsami.8b1593710.1021/acsami.8b15937 ↗
14. 10.1103/PhysRevB.11.438310.1103/PhysRevB.11.4383 ↗
15. 10.1021/acs.nanolett.9b0124610.1021/acs.nanolett.9b01246 ↗
16. 10.1038/s41586-019-1159-610.1038/s41586-019-1159-6 ↗
17. 10.1021/acsami.2c0311310.1021/acsami.2c03113 ↗
18. 10.1103/PhysRevLett.95.19640410.1103/PhysRevLett.95.196404 ↗
19. 10.1126/sciadv.aav681510.1126/sciadv.aav6815 ↗
20. 10.1002/smll.20180202510.1002/smll.201802025 ↗
21. 10.1038/ncomms881210.1038/ncomms8812 ↗
22. 10.1088/0957-4484/26/16/16520210.1088/0957-4484/26/16/165202 ↗
23. 10.1002/adma.20170216210.1002/adma.201702162 ↗
24. 10.1002/adma.20110466910.1002/adma.201104669 ↗
25. 10.1021/acsami.2c1019410.1021/acsami.2c10194 ↗
26. 10.1002/adom.20170120410.1002/adom.201701204 ↗
27. 10.1002/adom.20190017510.1002/adom.201900175 ↗
28. 10.1103/PhysRevLett.111.09660210.1103/PhysRevLett.111.096602 ↗
29. 10.1021/nl101457k10.1021/nl101457k ↗
30. 10.1038/nphys273310.1038/nphys2733 ↗
31. 10.1021/acsami.1c1040110.1021/acsami.1c10401 ↗
32. 10.1073/pnas.180841411510.1073/pnas.1808414115 ↗
33. 10.1021/acsnano.8b0303110.1021/acsnano.8b03031 ↗
34. 10.1021/acsaelm.2c0025710.1021/acsaelm.2c00257 ↗
35. 10.1002/adfm.20190558510.1002/adfm.201905585 ↗
36. 10.1021/acs.jpclett.0c0277310.1021/acs.jpclett.0c02773 ↗
37. 10.1088/0957-4484/6/1/00110.1088/0957-4484/6/1/001 ↗
38. 10.1063/1.149650610.1063/1.1496506 ↗
39. 10.1364/AO.56.00859810.1364/AO.56.008598 ↗
40. 10.1021/acsami.1c1614710.1021/acsami.1c16147 ↗
41. 10.1063/5.001904210.1063/5.0019042 ↗
42. 10.1088/1361-6463/ab796110.1088/1361-6463/ab7961 ↗
43. Palik, E. D. Handbook of Optical Constants of Solids II; Academic Press, 1991; pp 761–774.