Electrical Contact Barriers between a Three-Dimensional Metal and Layered SnS2
Abstract
Research context
OpenAlex topics: 2D Materials and Applications · Semiconductor materials and interfaces · Chalcogenide Semiconductor Thin Films
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Affiliations
School of Physics, Beijing Institute of Technology, Beijing 100081, P. R. China
Department of Computer and Communication, Kun Shan University, Tainan 710, Taiwan, ROC
Elementary Educational College, Beijing key Laboratory for Nano-Photonics and Nano-Structure, Capital Normal University, Beijing 100048, P. R. China
Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
Centre for Nano Science and Nano Technology, Panjab University, Chandigarh 160014, India
AMBER and CRANN, School of Chemistry, Trinity College Dublin, Dublin 2, Ireland
Department of Physics, National Taiwan University, Taipei 106, Taiwan, ROC
Center for Condensed Matter Sciences and Graduate Institute of Electronics Engineering, National Taiwan University, Taipei 106, Taiwan, ROC
Department of Electronics Engineering, National Kaohsiung University of Science and Technology, Kaohsiung 807, Taiwan, ROC
Funding
Ministry of Science and Technology of the People's Republic of China · Beijing Institute of Technology · National Natural Science Foundation of China