journal article·2019-12-18

Direct Observation of Charge Injection of Graphene in the Graphene/WSe2 Heterostructure by Optical-Pump Terahertz-Probe Spectroscopy

Liangliang Zhang, Zefeng Chen, Rui Zhang, Yong Tan, Tong Wu, Mostafa Shalaby, Rui Xie, Jianbin Xu

ACS Applied Materials & Interfaces· Volume 11· Issue 50
Publisher page

Abstract

Charge transfer across the interface and interlayer coupling in the graphene van der Waals heterostructure, which is constructed by graphene and semiconducting transition metal dichalcogenides (TMDCs), is critical for their electronic and optoelectronic applications. Photo-induced charge injection from TMDC to graphene has been studied in several heterostructure photodetectors. However, the response time significantly varies among different reports, ranging from microseconds to milliseconds. In this work, using a graphene/WSe2 heterostructure as an example, we directly observe the carrier density change in graphene by time-resolved optical-pump terahertz (THz)-probe spectroscopy and show the ultrafast picosecond photoresponse of graphene. In the absence of photoexcitation, THz time-domain spectroscopic measurements show that WSe2 can transfer holes to graphene and pull down the Fermi level of graphene. After excitation by the ultrafast laser pulse, the transient THz response shows a rapid (∼0.35 ps) increase in the graphene conductivity mainly due to the hole injection from WSe2 into graphene. Unlike previous reports on band bend as the guidance mechanism for charge transfer, our results show that the relevant mechanism is the band offset across the atomically sharp interface.
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Research context

OpenAlex topics: 2D Materials and Applications · Graphene research and applications · Topological Materials and Phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Beijing Advanced Innovation Center for Imaging Theory and Technology and Key Laboratory of Terahertz Optoelectronics (MoE), Department of Physics, Capital Normal University, Beijing 100048, China

Department of Electronic Engineering, The Chinese University of Hong Kong, Hong Kong SAR 999077, People’s Republic of China

Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China

School of Chemistry and Chemical Engineering, University of South China, Hengyang 421001, China

Funding

Natural Science Foundation of Beijing Municipality · National Natural Science Foundation of China · Chinese University of Hong Kong · Beijing Advanced Innovation Center for Imaging Theory and Technology, Capital Normal University

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