journal article·2016-09-07

Highly-Ordered 3D Vertical Resistive Switching Memory Arrays with Ultralow Power Consumption and Ultrahigh Density

Ahmed Al-Haddad, Chengliang Wang, Haoyuan Qi, Fabian Grote, Liaoyong Wen, Jörg Bernhard, Ranjith Vellacheri, Samar Tarish, Ghulam Nabi, Ute Kaiser, Yong Lei

Publisher page

Abstract

Resistive switching random access memories (RRAM) have attracted great scientific and industrial attention for next generation data storage because of their advantages of nonvolatile properties, high density, low power consumption, fast writing/erasing speed, good endurance, and simple and small operation system. Here, by using a template-assisted technique, we demonstrate a three-dimensional highly ordered vertical RRAM device array with density as high as that of the nanopores of the template (10(8)-10(9) cm(-2)), which can also be fabricated in large area. The high crystallinity of the materials, the large contact area and the intimate semiconductor/electrode interface (3 nm interfacial layer) make the ultralow voltage operation (millivolt magnitude) and ultralow power consumption (picowatt) possible. Our procedure for fabrication of the nanodevice arrays in large area can be used for producing many other different materials and such three-dimensional electronic device arrays with the capability to adjust the device densities can be extended to other applications of the next generation nanodevice technology.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advanced Memory and Neural Computing · Ferroelectric and Negative Capacitance Devices · Semiconductor materials and devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Institute of Physics & IMN MacroNano, Ilmenau University of Technology, Ilmenau 98693, Germany

Department of Physics, College of Science, University of Al-Mustansiryah, Baghdad, Iraq

School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China

Central Facility of Electron Microscopy, Electron Microscopy Group of Materials Science, University of Ulm, Albert Einstein Allee 11, 89081 Ulm, Germany

Funding

Bundesministerium für Bildung und Forschung · European Research Council · German Academic Exchange Service · Deutsche Forschungsgemeinschaft

References (52)

Show source-provided references
1. 10.1038/nnano.2012.24010.1038/nnano.2012.240 ↗
2. 10.1088/0034-4885/75/7/07650210.1088/0034-4885/75/7/076502 ↗
3. 10.1021/nl900006g10.1021/nl900006g ↗
4. 10.1103/PhysRevLett.92.17830210.1103/PhysRevLett.92.178302 ↗
5. 10.1007/s11706-012-0170-810.1007/s11706-012-0170-8 ↗
6. 10.1109/IEDM.2012.647908310.1109/IEDM.2012.6479083 ↗
7. 10.1109/IMW.2012.621364110.1109/IMW.2012.6213641 ↗
8. 10.1021/nn503713f10.1021/nn503713f ↗
9. 10.1002/adma.20140247210.1002/adma.201402472 ↗
10. 10.1038/srep0578010.1038/srep05780 ↗
11. 10.1109/IMW.2014.684938210.1109/IMW.2014.6849382 ↗
12. 10.1021/nl502654f10.1021/nl502654f ↗
13. 10.1021/nn403324t10.1021/nn403324t ↗
14. 10.1002/adma.20130295010.1002/adma.201302950 ↗
15. 10.1021/acs.jpcc.5b0266510.1021/acs.jpcc.5b02665 ↗
16. 10.1021/cm048609c10.1021/cm048609c ↗
17. 10.1039/c3tc31815j10.1039/c3tc31815j ↗
18. 10.1016/j.nanoen.2014.08.01910.1016/j.nanoen.2014.08.019 ↗
19. 10.1039/C1JM14592D10.1039/C1JM14592D ↗
20. 10.1002/adma.20120483910.1002/adma.201204839 ↗
21. 10.1039/C3TC31969E10.1039/C3TC31969E ↗
22. 10.1016/j.pmatsci.2006.07.00210.1016/j.pmatsci.2006.07.002 ↗
23. 10.1002/adfm.20120304210.1002/adfm.201203042 ↗
24. 10.1021/nn100234x10.1021/nn100234x ↗
25. 10.1021/nn500713h10.1021/nn500713h ↗
26. 10.1002/smll.20140043610.1002/smll.201400436 ↗
27. 10.1021/acsnano.5b0122610.1021/acsnano.5b01226 ↗
28. 10.1002/adma.20140276610.1002/adma.201402766 ↗
29. 10.1021/acsnano.5b0378910.1021/acsnano.5b03789 ↗
30. 10.1039/c1nr10296f10.1039/c1nr10296f ↗
31. 10.1039/C4TA05905K10.1039/C4TA05905K ↗
32. 10.1088/0957-4484/21/19/19520110.1088/0957-4484/21/19/195201 ↗
33. 10.1063/1.491867910.1063/1.4918679 ↗
34. 10.1038/nnano.2008.16010.1038/nnano.2008.160 ↗
35. 10.1063/1.239700610.1063/1.2397006 ↗
36. 10.1063/1.281869110.1063/1.2818691 ↗
37. 10.1039/C5EE00878F10.1039/C5EE00878F ↗
38. 10.1021/acs.chemmater.5b0063310.1021/acs.chemmater.5b00633 ↗
39. 10.1038/nmat307010.1038/nmat3070 ↗
40. 10.1016/j.matlet.2006.01.05210.1016/j.matlet.2006.01.052 ↗
41. 10.1017/S143192761101249910.1017/S1431927611012499 ↗
42. 10.1063/1.153311710.1063/1.1533117 ↗
43. 10.1002/adma.20060092910.1002/adma.200600929 ↗
44. 10.1016/j.cap.2009.12.01710.1016/j.cap.2009.12.017 ↗
45. 10.1063/1.344249910.1063/1.3442499 ↗
46. 10.1002/adfm.20150044410.1002/adfm.201500444 ↗
47. 10.1063/1.304387910.1063/1.3043879 ↗
48. 10.1063/1.490653210.1063/1.4906532 ↗
49. 10.1063/1.138283110.1063/1.1382831 ↗
50. 10.1109/TED.2008.200424610.1109/TED.2008.2004246 ↗
51. 10.1109/LED.2009.203627610.1109/LED.2009.2036276 ↗
52. 10.1109/JSSC.2004.83724410.1109/JSSC.2004.837244 ↗