journal article·2018-02-21

Atomic Layer Deposition of V1–xMoxO2 Thin Films, Largely Enhanced Luminous Transmittance, Solar Modulation

Xinrui Lv, Yunzhen Cao, Lu Yan, Ying Li, Yuzhi Zhang, Lixin Song

Publisher page

Abstract

V 1– x Mo x O 2 thin films were fabricated by nanolamination of VO 2 /MoO 3 alternating layers using atomic layer deposition (ALD) process, in which tetrakis-dimethyl-amino vanadium(IV) [V(NMe 2 ) 4 ] and molybdenum hexacarbonyl(VI) [Mo(CO) 6 ] were used as vanadium and molybdenum precursors, respectively. The dopant content of V 1– x Mo x O 2 films was controlled by adjusting MoO 3 cycle percentage ( P Mo ) in ALD pulse sequence, which varied from 2 to 10%. Effects of P Mo on V 1– x Mo x O 2 crystal structure, morphology, semiconductor-to-metal transition properties, and optical transmittance were studied. A linear reduction of phase transition temperature ( T c ) by approximately −11 °C/cycle % Mo was observed for V 1– x Mo x O 2 films within P Mo ≤ 5%. Notably, dramatic enhanced luminous transmittance ( T lum = 63.8%) and solar modulation (Δ T sol = 23.5%) were observed for V 1– x Mo x O 2 film with P Mo = 7%.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Transition Metal Oxide Nanomaterials · Semiconductor materials and devices · Advanced Memory and Neural Computing

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Key Laboratory of Inorganic Coating Materials CAS, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China

University of Chinese Academy of Sciences, Beijing 100049, China

Funding

Chinese Academy of Sciences

References (41)

Show source-provided references
1. 10.1021/cr900056b10.1021/cr900056b ↗
2. 10.1016/s0040-6090(02)00117-710.1016/s0040-6090(02)00117-7 ↗
3. 10.1039/c5nr06264k10.1039/c5nr06264k ↗
4. 10.1021/jp202356710.1021/jp2023567 ↗
5. 10.1142/s0218625x0200384610.1142/s0218625x02003846 ↗
6. 10.1021/cm020607+10.1021/cm020607+ ↗
7. 10.1016/j.ceramint.2017.03.08710.1016/j.ceramint.2017.03.087 ↗
8. 10.1103/physrevlett.3.3410.1103/physrevlett.3.34 ↗
9. 10.1016/j.rser.2013.05.03810.1016/j.rser.2013.05.038 ↗
10. 10.1016/j.tsf.2014.02.05510.1016/j.tsf.2014.02.055 ↗
11. 10.1063/1.292178410.1063/1.2921784 ↗
12. 10.1364/ao.37.00185810.1364/ao.37.001858 ↗
13. 10.1016/s0040-6090(03)00602-310.1016/s0040-6090(03)00602-3 ↗
14. 10.7567/jjap.53.06320110.7567/jjap.53.063201 ↗
15. 10.1021/acs.jpcc.6b0634710.1021/acs.jpcc.6b06347 ↗
16. 10.1016/j.apsusc.2016.10.04410.1016/j.apsusc.2016.10.044 ↗
17. 10.1039/c0jm01099e10.1039/c0jm01099e ↗
18. 10.4028/www.scientific.net/amm.492.37510.4028/www.scientific.net/amm.492.375 ↗
19. Mayer, M.SIMNRA, A Simulation Program for the Analysis of NRA, RBS and ERDA. InApplication of Accelerators in Research and Industry, Pts 1 and 2;Duggan, J. L.; Morgan, I. L., Eds. 1999; Vol.475, pp541–544.10.1063/1.59188 ↗
20. Wyszecki G. · 2000
21. 2008 · 14
22. 10.1016/0368-2048(94)02291-710.1016/0368-2048(94)02291-7 ↗
23. 10.1016/j.apsusc.2010.07.08610.1016/j.apsusc.2010.07.086 ↗
24. 10.1021/am500135d10.1021/am500135d ↗
25. 10.1103/physrevb.31.100010.1103/physrevb.31.1000 ↗
26. 10.1016/0169-4332(95)00317-710.1016/0169-4332(95)00317-7 ↗
27. 10.1116/1.492954110.1116/1.4929541 ↗
28. 10.1063/1.278691710.1063/1.2786917 ↗
29. 10.1063/1.37175110.1063/1.371751 ↗
30. 10.1016/0040-6090(96)08641-510.1016/0040-6090(96)08641-5 ↗
31. 10.1166/nnl.2015.207310.1166/nnl.2015.2073 ↗
32. 10.1364/oe.23.00a12410.1364/oe.23.00a124 ↗
33. 10.1016/j.jcis.2013.11.02810.1016/j.jcis.2013.11.028 ↗
34. 10.1039/c4ta05559d10.1039/c4ta05559d ↗
35. 10.1039/c6tc02694j10.1039/c6tc02694j ↗
36. 10.1039/c4ta02880e10.1039/c4ta02880e ↗
37. 10.1016/j.solmat.2009.03.02110.1016/j.solmat.2009.03.021 ↗
38. 10.1021/la502787q10.1021/la502787q ↗
39. 10.1021/la404666n10.1021/la404666n ↗
40. 10.1039/c4ta05035e10.1039/c4ta05035e ↗
41. 10.1002/pssa.20088179810.1002/pssa.200881798 ↗