Source abstract
Abstract
Negative differential resistance (NDR) has been extensively investigated for its wide device applications. However, a major barrier ahead is the low reliability. To address the reliability issues, we consider ferroelectrics and propose an alternative mechanism for realizing the NDR with deterministic current peak positions, in which the NDR results from the polarization switching-induced charge injection and subsequent charge trapping at the metal/ferroelectric interface. In this work, ferroelectric Au/BiFe 0.6 Ga 0.4 O 3 (BFGO)/Ca 0.96 Ce 0.04 MnO 3 (CCMO) nanocapacitors are prepared, and their ferroelectricity and NDR behaviors are studied concurrently. It is observed that the NDR current peaks are located at the vicinity of coercive voltages ( V c ) of the ferroelectric nanocapacitors, thus evidencing the proposed mechanism. In addition, the NDR effect is reproducible and robust with good endurance and long retention time. This study therefore demonstrates a ferroelectric-based NDR device, which may facilitate the development of highly reliable NDR devices.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Ferroelectric and Negative Capacitance Devices · Advanced Memory and Neural Computing · Ferroelectric and Piezoelectric Materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Institute for Advanced Materials and Guangdong Provincial Key Laboratory of Quantum Engineering and Quantum Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou 510006, China
Laboratory of Solid State Microstructures and Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China
Funding
Ministry of Science and Technology of the People's Republic of China · National Natural Science Foundation of China · Natural Science Foundation of Guangdong Province · Guangdong Province
References (43)
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