journal article·2015-05-13

Tunable Ultraviolet Photoresponse in Solution-Processed p–n Junction Photodiodes Based on Transition-Metal Oxides

Ting Xie, Guannan Liu, Baomei Wen, Jong Y. Ha, Nhan V. Nguyen, Abhishek Motayed, Ratan Debnath

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Abstract

Solution-processed p-n heterojunction photodiodes have been fabricated based on transition-metal oxides in which NiO and ternary Zn(1-x)Mg(x)O (x = 0-0.1) have been employed as p-type and n-type semiconductors, respectively. Composition-related structural, electrical, and optical properties are also investigated for all the films. It has been observed that the bandgap of Zn(1-x)Mg(x)O films can be tuned between 3.24 and 3.49 eV by increasing Mg content. The fabricated highly visible-blind p-n junction photodiodes show an excellent rectification ratio along with good photoresponse and quantum efficiency under ultraviolet (UV) illumination. With an applied reverse bias of 1 V and depending on the value of x, the maximum responsivity of the devices varies between 0.22 and 0.4 A/W and the detectivity varies between 0.17 × 10(12) and 2.2 × 10(12) cm (Hz)(1/2)/W. The photodetectors show an excellent UV-to-visible rejection ratio. Compositional nonuniformity has been observed locally in the alloyed films with x = 0.1, which is manifested in photoresponse and X-ray analysis data. This paper demonstrates simple solution-processed, low cost, band tunable photodiodes with excellent figures of merit operated under low bias.
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Research context

OpenAlex topics: ZnO doping and properties · Gas Sensing Nanomaterials and Sensors · Transition Metal Oxide Nanomaterials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Materials Science and Engineering Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States

Department of Electrical and Computer Engineering, University of Maryland, College Park, Maryland 20742, United States

Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20742, United States

Semiconductor and Dimensional Metrology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States

Funding

National Institute of Standards and Technology

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