journal article·2021-09-22

Pt/(InGa)2O3/n-Si Heterojunction-Based Solar-Blind Ultraviolet Photovoltaic Detectors with an Ideal Absorption Cutoff Edge of 280 nm

Zhao Wang, Wei Zheng, Qichang Hu, Shiyan Lin, Yibing Wu, Dapeng Ye

ACS Applied Materials & Interfaces· Volume 13· Issue 37
Publisher page

Abstract

Ga2O3 is a popular material for research on solar-blind ultraviolet detectors. However, its absorption cutoff edge is 253 nm, which is not an ideal cutoff edge of 280 nm. In this work, by adjusting the ratio of In/Ga elements in the films, a high-quality (In0.11Ga0.89)2O3 film with an absorption cutoff edge of 280 nm was obtained, which owns a uniform surface and preferred orientation. On this basis, a solar-blind ultraviolet photovoltaic detector was constructed based on the Pt/(In0.11Ga0.89)2O3/n-Si heterojunction. When the device is exposed to 254 nm UV light, its open-circuit voltage (VOC) can reach 354 mV. Under 0 V bias, the device has a responsivity of 0.48 mA/W with a rise time of 0.47 s and a decay time of 0.37 s; under −7 V bias, the device achieves a responsivity of 16.96 mA/W with a rise time of 0.17 s and a decay time of 0.33 s. The spectral response characteristics of the device show that it has a selective response to solar-blind ultraviolet light (cutoff wavelength is 280 nm) with a rejection ratio (R254 nm/R310 nm), which is greater by more than two orders of magnitude. This work provides a good reference for adjusting the band gap of Ga2O3-based films and broadening their application fields.
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Research context

OpenAlex topics: Ga2O3 and related materials · ZnO doping and properties · Advanced Photocatalysis Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

College of Mechanical and Electrical Engineering, Fujian Agriculture and Forestry University, Fuzhou, Fujian 350002, China

State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials, Sun Yat-sen University, Guangzhou 510275, China

National Engineering Research Center for Optoelectronic Crystalline Materials, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou, Fujian 350002, China

Funding

Natural Science Foundation of Guangdong Province · Fujian Agriculture and Forestry University · National Engineering Research Center for Optoelectronic Crystalline Materials

References (44)

Show source-provided references
1. 10.1016/j.jallcom.2015.11.14510.1016/j.jallcom.2015.11.145 ↗
2. 10.1002/adfm.20180600610.1002/adfm.201806006 ↗
3. 10.1088/1361-6641/ab610210.1088/1361-6641/ab6102 ↗
4. 10.1002/smll.20160191310.1002/smll.201601913 ↗
5. 10.3390/en905036910.3390/en9050369 ↗
6. 10.1021/acsami.8b1952410.1021/acsami.8b19524 ↗
7. 10.1016/j.matlet.2020.12863810.1016/j.matlet.2020.128638 ↗
8. 10.1364/PRJ.7.00038110.1364/PRJ.7.000381 ↗
9. 10.1002/adfm.20170026410.1002/adfm.201700264 ↗
10. 10.1063/1.36267710.1063/1.362677 ↗
11. 10.1088/1674-1056/26/4/04730810.1088/1674-1056/26/4/047308 ↗
12. 10.1002/adom.20180069710.1002/adom.201800697 ↗
13. 10.1186/s43074-020-00022-w10.1186/s43074-020-00022-w ↗
14. 10.1021/acsami.9b1767910.1021/acsami.9b17679 ↗
15. 10.1016/j.apsusc.2018.12.04510.1016/j.apsusc.2018.12.045 ↗
16. 10.1021/acs.jpclett.9b0279310.1021/acs.jpclett.9b02793 ↗
17. 10.1016/j.jallcom.2016.09.08710.1016/j.jallcom.2016.09.087 ↗
18. 10.1039/C9TC02055A10.1039/C9TC02055A ↗
19. 10.1016/j.snb.2016.09.18110.1016/j.snb.2016.09.181 ↗
20. 10.1016/j.ccr.2010.12.01810.1016/j.ccr.2010.12.018 ↗
21. 10.1016/j.pnsc.2016.01.00810.1016/j.pnsc.2016.01.008 ↗
22. 10.1016/j.apsusc.2017.08.12710.1016/j.apsusc.2017.08.127 ↗
23. 10.1002/aelm.20167006010.1002/aelm.201670060 ↗
24. 10.1016/j.carbon.2019.03.02710.1016/j.carbon.2019.03.027 ↗
25. 10.1021/acsnano.7b0663310.1021/acsnano.7b06633 ↗
26. 10.1021/acsami.9b1835210.1021/acsami.9b18352 ↗
27. 10.1021/acsami.8b0718910.1021/acsami.8b07189 ↗
28. 10.1021/acsami.8b0486610.1021/acsami.8b04866 ↗
29. 10.1016/j.tsf.2015.02.00310.1016/j.tsf.2015.02.003 ↗
30. 10.1016/j.jallcom.2019.06.22410.1016/j.jallcom.2019.06.224 ↗
31. 10.3938/jkps.62.90210.3938/jkps.62.902 ↗
32. 10.1002/pssc.20077929710.1002/pssc.200779297 ↗
33. 10.1088/0268-1242/30/2/02400510.1088/0268-1242/30/2/024005 ↗
34. 10.1021/acs.jpclett.9b0239010.1021/acs.jpclett.9b02390 ↗
35. 10.1186/s43074-021-00028-y10.1186/s43074-021-00028-y ↗
36. 10.1002/adma.20210105910.1002/adma.202101059 ↗
37. 10.1186/s43074-020-00014-w10.1186/s43074-020-00014-w ↗
38. 10.1002/aelm.20180071410.1002/aelm.201800714 ↗
39. 10.1021/acsami.5b1195610.1021/acsami.5b11956 ↗
40. 10.1039/C7TC01741C10.1039/C7TC01741C ↗
41. 10.1016/j.jallcom.2016.04.13410.1016/j.jallcom.2016.04.134 ↗
42. 10.1039/C7CE01076A10.1039/C7CE01076A ↗
43. 10.1016/j.jallcom.2018.06.31310.1016/j.jallcom.2018.06.313 ↗
44. 10.1016/j.vacuum.2018.10.02510.1016/j.vacuum.2018.10.025 ↗