journal article·2020-02-12

Threshold-Tunable, Spike-Rate-Dependent Plasticity Originating from Interfacial Proton Gating for Pattern Learning and Memory

Zheng Yu Ren, Li Qiang Zhu, Yan Bo Guo, Ting Yu Long, Fei Yu, Hui Xiao, Hong Liang Lu

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Abstract

Recently, neuromorphic devices have been receiving increasing interest in the field of artificial intelligence (AI). Realization of fundamental synaptic plasticities on hard-ware devices would endow new intensions for neuromorphic devices. Spike-rate-dependent plasticity (SRDP) is one of the most important synaptic learning mechanisms in brain cognitive behaviors. It is thus interesting to mimic the SRDP behaviors on solid-state neuromorphic devices. In the present work, nanogranular phosphorus silicate glass (PSG)-based proton conductive electrolyte-gated oxide neuromorphic transistors have been proposed. The oxide neuromorphic transistors have good transistor performances and frequency-dependent synaptic plasticity behavior. Moreover, the neuromorphic transistor exhibits SRDP activities. Interestingly, by introducing priming synaptic stimuli, the modulation of threshold frequency value distinguishing synaptic potentiation from synaptic depression is realized for the first time on an electrolyte-gated neuromorphic transistor. Such a mechanism can be well understood with interfacial proton gating effects of the nanogranular PSG-based electrolyte. Furthermore, the effects of SRDP learning rules on pattern learning and memory behaviors have been conceptually demonstrated. The proposed neuromorphic transistors have potential applications in neuromorphic engineering.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advanced Memory and Neural Computing · Neuroscience and Neural Engineering · CCD and CMOS Imaging Sensors

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Physical Science and Technology, Ningbo University, Ningbo 315211, Zhejiang, People’s Republic of China

Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, Zhejiang, People’s Republic of China

School of Physical Science and Technology, Shanghai Tech University, Shanghai 201210, China

University of Chinese Academy of Science, Beijing 100049, People’s Republic of China

State Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University, Shanghai 200433, People’s Republic of China

Funding

Natural Science Foundation of Shanghai · Ningbo Municipal Bureau of Science and Technology · National Natural Science Foundation of China · Natural Science Foundation of Zhejiang Province · Open Project of State Key Laboratory of ASIC & System

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