journal article·2021-11

Breaking the Fundamental Limitations of Nanoscale Ferroelectric Characterization: Non‐Contact Heterodyne Electrostrain Force Microscopy (Small Methods 11/2021)

Qibin Zeng, Qicheng Huang, Hongli Wang, Caiwen Li, Zhen Fan, Deyang Chen, Yuan Cheng, Kaiyang Zeng

Small Methods· Volume 5· Issue 11
Publisher page

Abstract

Inside Front Cover In article number 2100639, Zeng and co-workers have developed a new SPM technique for nanoscale ferroelectric characterization, namely non-contact heterodyne electrostrain force microscopy (NC-HEsFM). NC-HEsFM breaks the fundamental limitations of the conventionally used piezoresponse force microscopy method by providing a brand-new non-contact yet non-destructive, high-resolution, non-optical, electrostatic force effect-eliminated, highly extreme environments compatible, and multi-functional ferroelectric characterization solution.
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Research context

OpenAlex topics: Advanced Sensor and Energy Harvesting Materials · Force Microscopy Techniques and Applications · Polymer Surface Interaction Studies

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Affiliations

Department of Mechanical Engineering National University of Singapore Singapore 117576 Singapore

Institute for Advanced Materials South China Academy of Advanced Optoelectronics South China Normal University Guangzhou 510006 China

The Key Lab of Guangdong for Modern Surface Engineering Technology National Engineering Laboratory for Modern Materials Surface Engineering Technology Institute of New Materials Guangdong Academy of Sciences Guangzhou 510650 China

Guangdong Provincial Key Laboratory of Optical Information Materials and Technology South China Academy of Advanced Optoelectronics South China Normal University Guangzhou 510006 China

Institute of High‐Performance Computing Agency for Science Technology and Research Singapore 138632 Singapore

Monash Suzhou Research Institute Suzhou 215123 China

NUS (Suzhou) Research Institute (NUSRI) Suzhou 215123 China

References

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