Performance investigation of a charge plasma tunnel FET with SiGe source pocket as a photosensor
Source abstract
Abstract
Abstract This study investigates a highly sensitive and low-power photosensor using a pocket-based charge plasma tunnel field-effect transistor (PCPTFET) structure for visible light detection. Here, zinc oxide, the transparent optical region over the channel, is the catalyst for the photo-sensing operation. When light strikes the sensitive portion of the device, creating optical charge carriers in the illumination region and substantially increases the device’s conductance. The analysis of various parametric and structural variations like intensity power density (Pj ), optical wavelength (λ), drain to source voltage (V DS), incident angle (θ), and silicon body thickness (t si) have been investigated for the reported pocket-based charge plasma TFET (PCPTFET) photosensor. Further, the PCPTFET’s superior performance as a highly sensitive photosensor is revealed by comparing the several optical figures of merit (FOM) with conventional tunnel field-effect transistor. The reported photosensor provides much-improved responsivity (R) of 1.52 A W−1 and quantum efficiency (η) of 4.96.
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Research context
OpenAlex topics: Advancements in Semiconductor Devices and Circuit Design · Semiconductor materials and devices · Nanowire Synthesis and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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