Interface diffusion and pyroelectric properties of Pb0.8La0.1Ca0.1Ti0.975O3/(Na0.85K0.15)0.5Bi0.5TiO3 hierarchical composite thin films
Source abstract
Abstract
Abstract Pb 0.8 La 0.1 Ca 0.1 Ti 0.975 O 3 (PLCT)/(Na 0.85 K 0.15 ) 0.5 Bi 0.5 TiO 3 (NKBT) hierarchical composite thin films were fabricated by a sol–gel process. The interface diffusion and electrical properties of the films were investigated in detail. X-ray diffraction patterns indicated that the PLCT/NKBT hierarchical composite thin film annealed at 500 °C possessed perovskite structure; X-ray reflectivity measurements suggested that no interface diffusion occurred in the PLCT/NKBT hierarchical composite thin film annealed at 500 °C, which effectively decreased its dielectric constant. The leakage current behavior and ferroelectric and pyroelectric properties of the films were then studied. The PLCT/NKBT hierarchical composite thin films annealed at 500 °C possessed the lowest dielectric constant (142), low loss (0.029), and highest pyroelectric coefficient (321 μC/m 2 K) of the films, which resulted in the highest figure of merit of 158 μC/m 2 K.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Ferroelectric and Piezoelectric Materials · Multiferroics and related materials · Dielectric materials and actuators
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (18)
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1. A modified figure of merit for pyroelectric energy harvesting10.1016/j.matlet.2014.10.004 ↗
2. PMN-PT–PZT composite films for high frequency ultrasonic transducer applications10.1016/j.sna.2012.02.031 ↗
3. Piezoelectric properties of cement based/PVDF/PZT composites10.1016/j.matlet.2014.05.040 ↗
4. Low-temperature crystallization and orientation evolution of Nb-doped Pb(Zr, Ti)O3 thin films using a Pb0.8Ca0.1La0.1Ti0.975O3 seed layer10.1016/j.scriptamat.2008.10.003 ↗
5. The fabrication and pyroelectric properties of single crystalline PZT nanorod synthesized by hydrothermal reaction10.1007/s10854-014-1775-8 ↗
6. PST thin films for electroaloric coolers10.1088/0022-3727/34/15/308 ↗
7. Effect of excess Pb on ferroelectric characteristics of conductive Al-doped ZnO and Sn-doped In2O3 top electrodes in PbLaZrTiOx capacitors10.3139/146.111154 ↗
8. Influence of seed layer on crystal orientation and electrical properties of (Na0.85K0.15)0.5Bi0.5TiO3 thin films prepared by a sol–gel process10.1016/j.ceramint.2013.05.035 ↗
9. The synthesis of lead-free ferroelectric Bi0.5Na0.5TiO3–Bi0.5K0.5TiO3 thin films by sol–gel method10.1016/j.matlet.2006.08.023 ↗
10. Enhanced performance of Pb0.8La0.1Ca0.1 Ti0.975O3/Pb(Nb0.01Zr0.2Ti0.8)O3 multilayer thin films for pyroelectric applications10.1063/1.3600336 ↗
11. Microstructure and electric properties of (Pb0.8Ca0.2)TiO3 thin films prepared by RF magnetron sputtering with a seed layer10.1016/j.matlet.2012.04.044 ↗
12. Effect of anneal conditions on electrical properties of Mn-doped (Na0.85K0.15)0.5Bi0.5TiO3 thin films prepared by sol–gel method10.1111/j.1551-2916.2010.04325.x ↗
13. Effect of Sc doping on the structure and electrical properties of (Na0.85K0.15)0.5Bi0.5TiO3 thin films prepared by sol–gel processing10.1111/j.1551-2916.2011.04428.x ↗
14. Effects of Mn-doping on the electrical properties of (Na0.8K0.2)0.5Bi0.5TiO3 ceramics
15. Pyroelectric and dielectric properties of Mn modified 0.82Bi0.5Na0.5TiO3–0.18Bi0.5K0.5TiO3 lead-free thick films10.1111/j.1551-2916.2009.03166.x ↗
16. Growth and characterization of undoped and Mn doped lead-free piezoelectric NBT–KBT single crystals10.1016/j.materresbull.2014.02.017 ↗
17. Enhanced performance of pyroelectric microsensors throug the introduction of nanoporosity10.1016/S0955-2219(03)00239-5 ↗
18. Low-temperature preparation of highly (100)-oriented PZT thin films using high oxygen-pressure processing10.1063/1.1952567 ↗