Ultrafast Multilevel Switching in Au/YIG/n‐Si RRAM
Source abstract
Abstract
Abstract Resistive random access memory (RRAM) with ultrafast and multilevel switching is extremely promising for next‐generation nonvolatile memory. Here, ultrafast unipolar resistive switchings (≈540 ps) with high off/on resistance ratio (≈104) are obtained in yttrium iron garnet Y3Fe5O12 (YIG)‐based resistive memory on n‐Si substrate. The sub‐nanosecond operation is also successfully performed up to 85 °C with an off/on resistance ratio of ≈103. In addition, by using different compliance currents for the set process, five discrete resistance levels with ultrafast switchings among them are achieved and the multilevel states show reliable retention (>104 s). The large, stable, reproducible, and reliable switching behaviors of the Au/YIG/n‐Si RRAM cell shows its great potential for ultrafast multilevel memory applications.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Advanced Memory and Neural Computing · Ferroelectric and Negative Capacitance Devices · Transition Metal Oxide Nanomaterials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Hefei National Laboratory for Physical Sciences at the Microscale Department of Physics and CAS Key Laboratory of Strongly‐coupled Quantum Matter Physics University of Science and Technology of China Hefei 230026 China
Collaborative Innovation Center of Advanced Microstructures Nanjing 210093 China
Funding
National Natural Science Foundation of China
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