journal article·2019-08

Synthesis, structural and optical properties of $$\hbox {K}0.5\hbox {Na}0.5\hbox {NbO}3$$K0.5Na0.5NbO3 thin films prepared by spin coating route

Shammi Kumar, Nagesh Thakur

Bulletin of Materials Science· Volume 42· Issue 4
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Abstract

In this paper, lead-free sodium potassium niobate thin films have been prepared by using a chemical solution deposition-based spin coating route. The effect of different anealing temperatures on structural and optical properties has been studied. The phase analysis of thin films was investigated by using X-ray diffraction analysis. The microstructure and surface roughnes of thin films were studied by using atomic force microscopy. Raman spectroscopy analysis revealed that increase in annealing temperature gives rise to better crystallinity and perovskite phase. Optical parameter of thin films has been studied by using reflectance spectroscopy at room temperature. Photoluminescence analysis has been conducted by using an exciting wavelength of 300 nm at room temperature.
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Research context

OpenAlex topics: Ferroelectric and Piezoelectric Materials · Microwave Dielectric Ceramics Synthesis · Photorefractive and Nonlinear Optics

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (19)

Show source-provided references
1. Jaffe B, Cook W R and Jaffe H 1971 Piezoelectric ceramics (New York: Academic Press)
2. Raju K and Venugopal Reddy P 2010 Curr. Appl. Phys. 10 3110.1016/j.cap.2009.04.017 ↗
3. Saito Y, Takao H and Tani T 2004 Nature 432 8410.1038/nature03028 ↗
4. Yan X, Ren W and Wu X Q 2010 J. Alloys Compd. 508 12910.1016/j.jallcom.2010.08.025 ↗
5. Wang Y L, Lu Y Q and Wu M J 2012 Ceram. Int. 38 S29510.1016/j.ceramint.2011.04.105 ↗
6. Egerton L and Dillon D M 1959 J. Am. Ceram. Soc. 42 43810.1111/j.1151-2916.1959.tb12971.x ↗
7. Nakashima Y, Sakamoto W, Shimura T and Yogo T 2007 Jpn. J. Appl. Phys. 46 697110.1143/JJAP.46.6971 ↗
8. Ostling M, Koo S M, Zetterling C M, Khartsev S and Grishin A 2004 Thin Solid Films 444 469
9. Tian A F, Ren W, Wang L Y, Chen X, Wu X, Yao Xi et al 2012 Appl. Surf. Sci. 258 267410.1016/j.apsusc.2011.10.116 ↗
10. Ryu J, Choi J-J, Hahn B-D, Park D-S, Yoon W-H, Kim K-H et al 2007 Appl. Phys. Lett. 90 15290110.1063/1.2720751 ↗
11. Cho C-R 2002 Mater. Lett. 57 78110.1016/S0167-577X(02)00872-8 ↗
12. Lai F and Li F-F 2007 J. Sol–Gel Sci. Technol. 42 28710.1007/s10971-007-0741-9 ↗
13. Blomqvist M, Koh J H, Khartsev S and Grishin A 2002 Appl. Phys. Lett. 81 33710.1063/1.1492854 ↗
14. Vendrell X, Raymond O, Ochoa D A, Garcia J E and Mestres L 2015 Thin Solid Films 577 3510.1016/j.tsf.2015.01.038 ↗
15. Li N, Li W L, Zhang S Q and Fei W D 2011 Thin Solid Films 519 507010.1016/j.tsf.2011.01.130 ↗
16. Cho C-R and Grishin A 2000 J. Appl. Phys. 87 443910.1063/1.373089 ↗
17. Dai Y, Zhang X and Zhou G 2007 Appl. Phys. Lett. 90 26290310.1063/1.2751607 ↗
18. Aydõn C, Al-Hartomy O A, Al-Ghamdi A A, Al-Hazmi F, Yahia I S, Yakuphanoglu F et al 2012 J. Electroceram. 29 15510.1007/s10832-012-9748-x ↗
19. Senthilkumar V, Vickraman P and Ravikumar R 2010 J. Sol–Gel Sci. Technol. 53 31610.1007/s10971-009-2094-z ↗