An Investigation of the Electrical Degradation of GaN High-Electron-Mobility Transistors by Numerical Simulations of DC Characteristics and Scattering Parameters
Source abstract
Abstract
The effects of direct-current (DC) stress on GaN high-electron-mobility transistors (HEMTs) are investigated by means of numerical simulations, by which the creation of an acceptor trap in the AlGaN barrier layer was correlated to the observed experimental degradation. An increase in the trap concentration induces a worsening of the saturated current I DSS, transconductance g m, and output conductance g O. An increase in the length of the trapping region induces a degradation of I DSS and g m, but can reduce g O. Analysis of scattering parameters in the saturation region shows that the cutoff frequency f T matches the trend of g m.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: GaN-based semiconductor devices and materials · Ga2O3 and related materials
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References (13)
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