journal article·2017-08

Bulk Crystal Growth, and High-Resolution X-ray Diffraction Results of LiZnAs Semiconductor Material

Benjamin W. Montag, Michael A. Reichenberger, Madhana Sunder, Philip B. Ugorowski, Kyle A. Nelson, Luke C. Henson, Douglas S. McGregor

Journal of Electronic Materials· Volume 46· Issue 8
Publisher page

Abstract

LiZnAs is being explored as a candidate for solid-state neutron detectors. The compact form, solid-state device would have greater efficiency than present day gas-filled 3He and 10BF3 detectors. Devices fabricated from LiZnAs having either natural Li (nominally 7.5% 6Li) or enriched 6Li (usually 95% 6Li) as constituent atoms may provide a material for compact high efficiency neutron detectors. The 6Li(n,t)4He reaction yields a total Q-value of 4.78 MeV, an energy larger than that of the 10B reaction, which can easily be identified above background radiations. LiZnAs material was synthesized by preparing equimolar portions of Li, Zn, and As sealed under vacuum (10−6 Torr) in quartz ampoules lined with boron nitride and subsequently reacted in a compounding furnace (Montag et al. in J Cryst Growth 412:103, 2015). The raw synthesized LiZnAs was purified by a static vacuum sublimation in quartz (Montag et al. in J Cryst Growth 438:99, 2016). Bulk crystalline LiZnAs ingots were grown from the purified material with a high-temperature Bridgman-style growth process described here. One of the largest LiZnAs ingots harvested was 9.6 mm in diameter and 4.2 mm in length. Samples were harvested from the ingot and were characterized for crystallinity using a Bruker AXS Inc. D8 AXS Inc. D2 CRYSO, energy dispersive x-ray diffractometer, and a Bruker AXS Inc. D8 DISCOVER, high-resolution x-ray diffractometer equipped with molybdenum radiation, Gobel mirror, four bounce germanium monochromator and a scintillation detector. The primary beam divergence was determined to be 0.004°, using a single crystal Si standard. The x-ray based characterization revealed that the samples nucleated in the (110) direction and a high-resolution open detector rocking curve recorded on the (220) LiZnAs yielded a full width at half maximum (FWHM) of 0.235°. Sectional pole figures using off-axis reflections of the (211) LiZnAs confirmed in-plane ordering, and also indicated the presence of multiple domains. The LiZnAs bulk crystals exhibited a Primitive Cubic Bravais lattice instead of the commonly reported Face-centered Cubic Bravais lattice. The lattice constant was determined to be 5.5146 ± 0.0003 A.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Nuclear Physics and Applications · Radiation Detection and Scintillator Technologies · X-ray Diffraction in Crystallography

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (34)

Show source-provided references
1. B.W. Montag, M.A. Reichenberger, K.R. Arpin, M. Sunder, K.A. Nelson, P.B. Ugorowski, and D.S. McGregor, J. Cryst. Growth 412, 103 (2015).10.1016/j.jcrysgro.2014.10.019 ↗
2. B.W. Montag, M.A. Reichenberger, P.B. Ugorowski, M. Sunder, J. Weeks, and D.S. McGregor, J. Cryst. Growth 438, 99 (2016).10.1016/j.jcrysgro.2015.12.023 ↗
3. R. Juza, K. Langer, and K. Von Benda, Angew. Chem. Int. Edit. 7, 360 (1968).10.1002/anie.196803601 ↗
4. H. Nowotny and K. Bachmayer, Monatsh. Chem. 81, 488 (1950).10.1007/BF00906437 ↗
5. D. Kieven, A. Grimm, A. Beleanu, C.G.F. Blum, J. Schmidt, T. Rissom, I. Lauermann, T. Gruhn, C. Felser, and R. Klenk, Thin Solid Films 519, 1866 (2011).10.1016/j.tsf.2010.10.045 ↗
6. R. Bacewicz and T.F. Ciszek, Appl. Phys. Lett. 52, 1150 (1988).10.1063/1.99188 ↗
7. K. Kuriyama, T. Katoh, and N. Mineo, J. Cryst. Growth 108, 37 (1991).10.1016/0022-0248(91)90351-5 ↗
8. Z.W. Bell, K.R. Pohl, and L. Van Den Berg, IEEE Trans. Nucl. Sci. 51, 1163 (2004).10.1109/TNS.2004.829651 ↗
9. A.G. Vradii, M.I. Krapivin, L.V. Maslova, O.A. Matveev, A.K. Khusainov, and V.K. Shashurin, At. Energy 42, 64 (1977).10.1007/BF01119710 ↗
10. A.G. Beyerle and K.L. Hull, Nucl. Inst. Methods A 256, 377 (1987).10.1016/0168-9002(87)90236-1 ↗
11. D.S. McGregor, J.T. Lindsay, and R.W. Olsen, Nucl. Inst. Methods A 381, 498 (1996).10.1016/S0168-9002(96)00580-3 ↗
12. Y. Kumashiro, K. Kudo, K. Matsumoto, Y. Okada, and T. Koshiro, J. Less Common Met. 143, 71 (1988).10.1016/0022-5088(88)90031-8 ↗
13. W.C. McGinnis, SPAWAR Systems Center, Technical Report 19212003.
14. J.C. Lund, F. Olschner, F. Ahmed, and K. S. Shah, MRS Online Proceedings Library, vol. 162 (1989), p. 601.10.1557/PROC-162-601 ↗
15. F.P. Doty, Boron Nitride Solid State Neutron Detector, US-6727504 (2004).
16. A.N. Caruso, P.A. Dowben, S. Balkir, N. Schemm, K. Osberg, R.W. Fairchild, O.B. Flores, S. Balaz, A.D. Harken, B.W. Robertson, and J.I. Brand, Mater. Sci. Eng. B 135, 129 (2006).10.1016/j.mseb.2006.08.049 ↗
17. B.W. Robertson, S. Adenwalla, A. Harken, P. Welsch, J.I. Brand, P.A. Dowben, and J.P. Claassen, Appl. Phys. Lett. 80, 3644 (2002).10.1063/1.1477942 ↗
18. P. Groot, J.H.F. Grondel, and P.J. Van Der Put, Solid State Ion. 16, 95 (1985).10.1016/0167-2738(85)90029-3 ↗
19. A.N. Caruso, R.B. Billa, S. Balaz, J.I. Brand, and P.A. Dowben, J. Phys. Condens. Matter 16, L139 (2004).10.1088/0953-8984/16/10/L04 ↗
20. D.S. McGregor, M.D. Hammig, Y.H. Yang, H.K. Gersch, and R.T. Klann, Nucl. Inst. Methods A 500, 272 (2003).10.1016/S0168-9002(02)02078-8 ↗
21. K. Kuriyama, T. Kato, and K. Kawada, Phys. Rev. B Condens. Matter 49, 11452 (1994).10.1103/PhysRevB.49.11452 ↗
22. K. Kuriyama and F. Nakamura, Phys. Rev. B Condens. Matter 36, 4439 (1987).10.1103/PhysRevB.36.4439 ↗
23. R. Bacewicz and T.F. Ciszek, Acta Phys. Pol. A A77, 379 (1990).
24. K. Kuriyama, T. Kato, T. Kato, and H. Matsuno, J. Cryst. Growth 166, 631 (1996).10.1016/0022-0248(95)00512-9 ↗
25. W. Hoenle, Z. Naturforsch. B Chem. Sci. 48, 683 (1993).10.1515/znb-1993-0518 ↗
26. S.H. Wei and A. Zunger, Phys. Rev. Lett. 56, 528 (1986).10.1103/PhysRevLett.56.528 ↗
27. B.W. Montag, M.A. Reichenberger, M. Sunder, P.B. Ugorowski, K.A. Nelson, and D.S. McGregor, J. Cryst. Growth 419, 143 (2015).10.1016/j.jcrysgro.2015.03.001 ↗
28. Bruker AXS Inc., “brochure_D2_CRYSO.pdf” (2014). http://bruker.poznan.pl/images/stories/AXS/brochure_D2_ CRYSO.pdf . Accessed 3 Apr 2017.
29. R.E. Dinnebier and S.J.L. Billinge, Powder Diffraction: Theory and Practice (Cambridge: The Royal Society of Chemistry, 2008).10.1039/9781847558237 ↗
30. A. Le Bail, Powder Diffr. 20, 316 (2005).10.1154/1.2135315 ↗
31. W. Kraus and G. Nolze, J. Appl. Cryst. 29, 301 (1996).10.1107/S0021889895014920 ↗
32. J.P. Zhao, M.H. Quan, and L. Zhang, Ceram. Int. 32, 843 (2006).10.1016/j.ceramint.2005.05.010 ↗
33. W. Walukiewicz, L. Lagowski, L. Jastrzebski, M. Lichtensteiger, and H.C. Gatos, J. Appl. Phys. 50, 899 (1979).10.1063/1.326008 ↗
34. F. Robert, Pierret, Advanced Semiconductor Fundamentals, 2nd ed. (Upper Saddle River: Pearson Education Inc, 2003).