journal article·2004-07

Ferroelectric and Dielectric Properties of Lanthanum-Modified Bismuth Titanate Thin Films Obtained by the Polymeric Precursor Method

A. Z. Sim�es, A. H. M. Gonzalez, C. S. Riccardi, E. C. Souza, F. Moura, M. A. Zaghete, E. Longo, J. A. Verela

Journal of Electroceramics· Volume 13· Issue 1-3
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Abstract

Lanthanum-modified bismuth titanate, Bi4 − xLaxTi3O12 (BLT), thin films with a La concentration of 0.75 was grown on Pt/Ti/SiO2/Si substrates by using the polymeric precursor solution and spin-coating method. The scanning electron microscopy (SEM) showed rounded grains, which is not typical for these system. The BLT films showed well-saturated polarization-electric field curve which 2Pr = 41.4 μC/cm2 and Vc = 0.99 V. The capacitance dependence on the voltage is strongly nonlinear, confirming the ferroelectric properties of the film resulting from the domains switching. These properties make BLT a promising material for FERAM applications.
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Research context

OpenAlex topics: Ferroelectric and Piezoelectric Materials · Acoustic Wave Resonator Technologies · Photorefractive and Nonlinear Optics

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