Spatial distribution of damage caused by 6.4 eV photon irradiation in the gate oxide MOSFET's
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Abstract
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Research context
OpenAlex topics: Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis · Advancements in Semiconductor Devices and Circuit Design
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References (11)
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11. Groescheken · IEEE Trans. Electron Devices · 1984 · ED-31 · 4210.1109/T-ED.1984.21472 ↗