Contrast reversal in SAM mapping due to changes in the substrate atomic number
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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Semiconductor materials and devices
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References (10)
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7. Shirley · Phys. Rev. B · 1972 · 5 · 470910.1103/PhysRevB.5.4709 ↗
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9. El Gomati · Appl. Surface Sci. · 1985 · 24 · 14710.1016/0169-4332(85)90220-X ↗
10. El Gomati · Surface Interface Anal. · 1988 · 11 · 25110.1002/sia.740110506 ↗