Further indication of a low quartz structure at the SiO2/Si interface from coincidence Doppler broadening spectroscopy
Source abstract
Abstract
Abstract Results from coincidence Doppler broadening (CDB) measurements on various Si samples and Brazilian quartz having low quartz structure are presented with the aim to give further strong indication of the existence of a low quartz structure, but not of Si divacancies as frequently considered, at the SiO2/Si interface.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Cultural Heritage Materials Analysis · Geophysical Methods and Applications · Laser-induced spectroscopy and plasma
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References (10)
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