journal article·1996-09

Surface and subsurface imaging of indium in InGaAs by scanning tunneling microscopy

M. Pfister, M.B. Johnson, S.F. Alvarado, H.W.M. Salemink, U. Marti, D. Martin, F. Morier-Genoud, F.K. Reinhart

Applied Surface Science· Volume 104-105
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Surface and Thin Film Phenomena · Semiconductor Quantum Structures and Devices · Force Microscopy Techniques and Applications

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References (14)

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