Corrigendum to “SEM/EDX and XPS studies of niobium after electropolishing” by T. Hryniewicz, K. Rokosz, H.R. Zschommler Sandim [Appl. Surf. Sci., yyy (2012) xxx], http://dx.doi.org/10.1016/j.apsusc.2012.09.060
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OpenAlex topics: Advanced Memory and Neural Computing · Analytical Chemistry and Sensors · Semiconductor materials and devices
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References (12)
Show source-provided references
1. Hryniewicz · Applied Surface Science · 2012
2. Müller · Applied Surface Science · 2012
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6. Biesinger · Surface and Interface Analysis · 2009 · 41 · 32410.1002/sia.3026 ↗
7. Rokosz · 2012
8. Hota · Thin Solid Films · 2012 · 520 · 664810.1016/j.tsf.2012.07.026 ↗
9. Chen · Chinese Chemical Letters · 2007 · 18 · 101710.1016/j.cclet.2007.05.038 ↗
10. Rjeb · Moroccan Journal of Condensed Matter · 2004 · 5 · 168
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12. Klug · The Journal of Physical Chemistry C · 2011 · 115 · 2506310.1021/jp207612r ↗