The ohmic contact to the silicon Schottky barrier using vanadium silicide and gold or silver metallization
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Semiconductor materials and interfaces · Silicon and Solar Cell Technologies · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (6)
Show source-provided references
1. Lang · J. Appl. Phys. · 1974 · 45 · 302310.1063/1.1663719 ↗
2. L.S. Berman, A.D. Remenyuk and M.G. Tolstobrov, Preprint No. 947 (Ioffe Physical Technical Institute, Academy of Sciences of the USSR, Leningrad, 1985
3. Morgan · Surf. Sci. · 1988 · 204 · 42810.1016/0039-6028(88)90224-5 ↗
4. Clabes · Phys. Rev. B · 1984 · 29 · 154010.1103/PhysRevB.29.1540 ↗
5. Clabes · J. Vac. Sci. Technol. · 1981 · 19 · 26210.1116/1.571117 ↗
6. Clabes · J. Vac. Sci. Technol. · 1982 · 20 · 68410.1116/1.571628 ↗