journal article·2008-05

Scanning tunneling microscopy investigations of silicon carbide nanowires

A. Busiakiewicz, Z. Klusek, A. Huczko, P.J. Kowalczyk, P. Dąbrowski, W. Kozłowski, S. Cudziło, P.K. Datta, W. Olejniczak

Applied Surface Science· Volume 254· Issue 14
Publisher page

Abstract

Scanning tunneling microscopy (STM) images have been obtained from the surfaces of silicon carbide nanowires produced in the thermolysisinduced carbonization of halocarbons (combustion synthesis). The morphology of the nanowires shows trench-like features perpendicular to the fibres’ axis, which isassigned tothe existence of microfacets ontheirsidewalls. Forthefirsttimehigh-resolutionSTM imagesof theSiCnanowires are presented. The results are in agreement with the previous reports suggesting the presence of microfacets on the SiC whiskers’ surface. # 2008 Elsevier B.V. All rights reserved.
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Research context

OpenAlex topics: Carbon Nanotubes in Composites · Diamond and Carbon-based Materials Research · Silicon Nanostructures and Photoluminescence

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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